ATS 2012 - The 21st Asian Test Symposium

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
Major topics include, but are not limited to:
Automatic Test Pattern Generation (ATPG)
Analog Test / Mixed-Signal Test
Boundary Scan Test
Board and System Test
Built-In Self-Test
Design for Testability (DFT)
Design Verification and Validation
Defect-Based Testing
Delay and Performance Test
Diagnosis and Debug
Dependable System
Economics of Test
Fault Modeling and Simulation
Fault Tolerance
High-Speed I/O Test / RF Testing
Memory Test / FPGA Test
On-Line Test
System-on-a-Chip Test
System-in-package (SiP)/ 3D Test
Software Testing / Software Design for Testing
Test Compression
Temperature/Power-aware Test
Test Quality
Yield Analysis and Enhancement