CIT 2016 - 16th IEEE International Conference on Computer and Information Technology

IEEE CIT 2016 is the 16th edition of the highly successful International Conference on Computer and Information Technology. The goal of the conference is to provide a forum for scientists, engineers and researchers to discuss and exchange novel ideas, results, experiences and work-in-process on all aspects of computer and information technology. CIT has become a major platform for researchers and industry practitioners from different fields of computer and information technology. Each year, CIT attendees appreciate and benefit from multidisciplinary exchanges in computer and information technology. In previous years, CIT has attracted many high quality research papers spanning over the various aspects of information technology, computing science and computer engineering. These papers highlight foundational work that strives to push beyond limits of existing computer technologies, including experimental efforts, innovative systems, and investigations that identify weaknesses in existing IT services.
IEEE CIT 2016 will be held on 8-10 December 2016 in Shangri-La's Fijian Resort and Spa, Fiji, co-located with SC2-2016, IOV 2016, and IEEE SocialSec 2016. Learn More.
Call For Papers
IEEE CIT 2016 welcomes original and innovative research on computer and information technology from the academia, industry and government. Topics of particular interests include the following tracks, but are not limited to:
Information Technology
Computer Science
Signal Processing
Networking and Internet of Things
Reliability, Security, Privacy and Trust
Applications, Business and Social Issues
Database and Data Management
Microwave and Radar
System Software and Software Engineering
Pattern Recognition, Data Mining and Artificial Intelligence
Information Technology for Biomedicine and Smart Health
Wireless Communications
Mobile Multimedia Communications
Wireless and Mobile Computing
Future Internet
Cellular Network and 5G
Social Computing and Social Network