DATE 2017 - 20th DATE conference and exhibition
Date2017-03-27 - 2017-03-31
Deadline2016-09-11
VenueSwiss Tech Convention Center, Lausanneingapore, Switzerland
Keywords
Topics/Call fo Papers
The 20th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on both ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software.
Structure of the Event
The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-of-the-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, such as automotive, wireless, telecom and multimedia applications. The organization of user group meetings, fringe meetings, a university booth, a PhD Forum, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results. More details are given on the DATE website (www.date-conference.com).
Areas of Interest
Within the scope of the conference, the main areas of interest are: embedded systems, design methodologies, CAD languages, algorithms and tools, testing of electronic circuits and systems, embedded software, applications design and industrial design experiences. Topics of interest include, but are not restricted to:
System Specification and Modeling
System Design, Synthesis and Optimization
Simulation and Validation
Design of Low Power Systems
Temperature-Aware Design
Power Estimation and Optimization
Temperature Modeling and Management
Emerging Technologies, Systems and Applications
Formal Methods and Verification
Network on Chip
Architectural and Microarchitectural Design
Architectural and High-Level Synthesis
Reconfigurable Computing
Logic and Technology Dependent Synthesis for Deep-Submicron Circuits
Physical Design and Verification
Analogue and Mixed-Signal Circuits and Systems
Interconnect, EMC, EMD and Packaging Modeling
Multiprocessor System-on-Chip and Computing Systems
Communication, Consumer and Multimedia Systems
Transportation Systems
Medical, Healthcare and Assistive Technology Systems
Energy Generation, Recovery and Management Systems
Secure, Dependable and Adaptive Systems
Test for Defects, Variability, and Reliability
Test Generation, Simulation and Diagnosis
Test for Mixed-Signal, Analog, RF, MEMS
Test Access, Design-for-Test, Test Compression, System Test
On-Line Testing and Fault Tolerance
Real-time, Networked and Dependable Systems
Compilers and Code Generation for Embedded Systems; Software-centric System Design Exploration
Model-based Design and Verification for Embedded Systems
Embedded Software Architectures and Principles; Software for MPSoC, Multi/many-core and GPU-based Systems
Structure of the Event
The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-of-the-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, such as automotive, wireless, telecom and multimedia applications. The organization of user group meetings, fringe meetings, a university booth, a PhD Forum, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results. More details are given on the DATE website (www.date-conference.com).
Areas of Interest
Within the scope of the conference, the main areas of interest are: embedded systems, design methodologies, CAD languages, algorithms and tools, testing of electronic circuits and systems, embedded software, applications design and industrial design experiences. Topics of interest include, but are not restricted to:
System Specification and Modeling
System Design, Synthesis and Optimization
Simulation and Validation
Design of Low Power Systems
Temperature-Aware Design
Power Estimation and Optimization
Temperature Modeling and Management
Emerging Technologies, Systems and Applications
Formal Methods and Verification
Network on Chip
Architectural and Microarchitectural Design
Architectural and High-Level Synthesis
Reconfigurable Computing
Logic and Technology Dependent Synthesis for Deep-Submicron Circuits
Physical Design and Verification
Analogue and Mixed-Signal Circuits and Systems
Interconnect, EMC, EMD and Packaging Modeling
Multiprocessor System-on-Chip and Computing Systems
Communication, Consumer and Multimedia Systems
Transportation Systems
Medical, Healthcare and Assistive Technology Systems
Energy Generation, Recovery and Management Systems
Secure, Dependable and Adaptive Systems
Test for Defects, Variability, and Reliability
Test Generation, Simulation and Diagnosis
Test for Mixed-Signal, Analog, RF, MEMS
Test Access, Design-for-Test, Test Compression, System Test
On-Line Testing and Fault Tolerance
Real-time, Networked and Dependable Systems
Compilers and Code Generation for Embedded Systems; Software-centric System Design Exploration
Model-based Design and Verification for Embedded Systems
Embedded Software Architectures and Principles; Software for MPSoC, Multi/many-core and GPU-based Systems
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- 2nd Workshop on design of Low Power EMbedded Systems
- First International Workshop on In-Memory and In-Storage Computing with Emerging Technologies
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Last modified: 2016-05-10 22:49:08