MSM 2011 - Microscopy of Semiconducting Materials 2011 (MSM-XVIII)

The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the applications of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

Key dates

Abstract submission deadline: 19 December 2010
Early registration deadline: 17 February 2011
Registration deadline: 27 March 2011
Paper submission deadline: 4 April 2011