STA 2016 - 8th IEEE International Workshop on Software Test Automation

Test automation aims to reduce the cost and improve the effectiveness of software testing by using various techniques and methods. Other benefits are consistency and accuracy, reduction of overall test cycle time, risk mitigation of manual testing, and increase in overall product quality. Recording test activities as test scripts and playing the test scripts or record and playback are the common methods. More advanced methodologies include data-driven, keyword-driven and hybrid methods as well as framework-based methods. Among tool development, interoperability remains a major challenge.
Theme and Scope of the Workshop (Call-for-Papers)
This year's theme of COMPSAC is "Connected World: New Challenges for Data, Systems & Applications". Our world becomes more and more connected every day, with billions of computer applications, devices, and services interacting globally to make our lives safer, convenient, and more enjoyable. Computations, as well as sharable data and applications, are becoming available everywhere. This explosive growth brings us closer together and requires innovative technical solutions. With the rapidly shrinking gap between cyber and physical domains, we face many new challenges and new opportunities for computers, software, and applications. COMPSAC 2016 will provide a platform for in-depth discussion of such challenges both in traditional and in emerging fields such as smart and connected health, wearable computing, the Internet of Things, cyber-physical systems, social networking, and the smart planet.
Accordingly, submissions including applications and case studies in these areas will highly be appreciated.
Topics of interest include, but are not limited to, the following:
Model Based Testing
Test automation in the context of different software development lifecycle methodologies
Product Line Testing
Support for testing methods, Test framework.
Operation, maintenance and evolution of test tools and environments
Application in different domains
Experiments, empirical studies, experience reports, and case studies.
Test efficiency, Test effectiveness, and Lean testing approaches.
Quantitative studies including cost vs. benefit studies.
The length of a camera ready paper will be limited to 6 pages (IEEE Proceedings style) with up to 2 additional pages (with charges for each additional page) printed on 10-12 point fonts. Authors must follow IEEE CS Press Proceedings Author Guidelines to prepare papers. At least one of the authors of each accepted paper is required to pay full registration fee and present the paper at the workshop in person.
Program Committee
Arun Bahulkar, Tata Research (TRRDC), India
Xiaoying Bai, Tsinghua University, China
Christof Budnik, Siemens, USA
Feza Buzluca, Istanbul Technical University, Turkey
Arilo Claudio, Federal University of Amazonas, Brazil
Atilla Elci, Eastern Mediterranean University, North Cyprus
Jerry Gao, San Jose State University, USA
Ron Kenett, KPA Ltd, Israel
Juncao Li, Microsoft, USA
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Marek Stochel, Motorola Solutions, Poland
Guilherme Travassos, Federal University of Rio de Janerio (UFRJ), Brazil
Dragos Truscan, Ãbo Akademi University, Finland
Tugkan Tuglular, Izmir University, Turkey
Andreas Ulrich, Siemens Corporate Technology, Germany
Xiangyu Zhang, Purdue University, USA