NSREC 2015 - 2015 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015)

Papers describing nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.
We are soliciting papers describing significant new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
Ionizing Radiation Effects
Materials and Device Effects
Displacement Damage
Single-Event Charge Collection Phenomena and Mechanisms
Radiation Transport, Energy Deposition and Dosimetry
Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
MOS, Bipolar, and Advanced Technologies
Isolation Technologies, such as SOI and SOS
Optoelectronic and Optical Devices and Systems
Methods for Hardened Design and Manufacturing
Modeling of Devices, Circuits and Systems
Particle Detectors and Associated Electronics for High-Energy Accelerators
Cryogenic or High Temperature Effects
Single-Event Effects
Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric, and Terrestrial Radiation Effects
Characterization and Modeling of Radiation Environments
Space Weather Events and Effects
Spacecraft Charging
Soft Error Rates (SER)
Hardness Assurance Technology and Testing
Testing Techniques, Guidelines and Hardness Assurance Methodology
Radiation Exposure Facilities
Dosimetry
New Developments of Interest the Radiation Effects Community