ETS 2009 - ETS 2009 14th European Test Symposium

General Chair:
J.L. Huertas Diaz ¨C CNM (E)
O. Novak - Czech Tech. Univ. (Cz)
Program Chair / Vice Chair:
J.-P. Teixeira ¨C IST/TUL, INESC-ID (P)
E. Gramatova ¨C Slovak Acad. Sc. (SK)
Topic Chairs:
B. Becker ¨C U. Freiburg (D)
S. Hellebrand ¨C U. Paderborn (D)
H. Kerkhoff ¨C U. Twente (NL)
E. Larsson ¨C Linköping U. (S)
R. Leveugle ¨C TIMA (F)
P. Muhmenthaler ¨C Infineon (D)
N. Nicolici ¨C McMaster U. (CAN)
M. Renovell ¨C LIRMM (F)
Industrial Relations Chair:
P. Harrod - ARM Ltd (UK)
Publication Chair:
C. Metra ¨C U. Bologna (I)
Panel Chair:
H.-J. Wunderlich ¨C U. Stuttgart (D)
Tutorial Chair:
P. Girard ¨C LIRMM (F)
Embedded Tutorial Chair:
P. Prinetto ¨C Politecnico di Torino (I)
ETS Fringe Workshops:
B. Al-Hashimi ¨C U. Southampton (UK)
Ph.D. Forum Chair:
I. Polian ¨C U. Freiburg (D)
Regional Liaisons:
L. Carro ¨C UFRGS (BR)
A. Singh ¨C Auburn U. (USA)
A. Osseiran ¨C Edith Cowan U. (AUS)
S. Kajihara ¨C Kyushu IT (J)
Program Committee:

M. Abadir, USA L. Miclea, RO
R. Aitken, USA S. Mir, F
Z. Al-Ars, NL S. Mitra, USA
D. Appello, I Y. Miura, J
F. Azais, F F. Novak, SLO
M. Azimane, NL O. Novak, CZ
L. Balado, E A. Orailoglu, USA
A. Benso, I S. Ozev, USA
G. Carlsson, S A. Pataricza, H
K. Chakrabarty,USA F. Poehl, D
W. Daehn, D I. Polian, D
R. Dorsch, D I. Pomeranz, USA
M.-L. Flottes, F J. Raik, EE
H. Fujiwara, J J. Rajski, USA
F. Fummi, I A. Richardson, UK
D. Gizopoulos, GR J. Rivoir, D
E, Gramatova, SK B. Rouzeyre, F
S. Hamdioui, NL A. Rubio, E
M. Hirech, USA A. Rueda, E
A. Hlawiczka, PL K.K. Saluja, USA
M. S. Hsiao, USA P. Sanchez, E
P. Hughes, UK S. Sattler, D
A. Ivanov, CAN J. Segura, E
S. Kajihara, J J.-P. Teixeira, P
A. R. Kapur, USA N. Touba, USA
A. Krasniewski, PL J. Tyszer, PL
B. Kruseman, NL R. Ubar, EE
S. Kundu, USA B. Vermeulen, NL
M. Lubaszewski, BR C. Wegener, D
Y. Makris, USA X. Wen, J
H. Manhaeve, B C.-W. Wu, TW
E.J. Marinissen, B M. Zwolinski, UK
M. Abadir, USA L. Miclea, RO
Steering Committee:
Chair: H.-J. Wunderlich ¨C U. Stuttgart (D)


Al-Hashimi, UK Z. Peng, S
B. Becker, D P. Prinetto, I
J. Figueras, E M. Renovell, F
C. Landrault, F M. Sonza Reorda, I
E.J. Marinissen, NL J.-P. Teixeira, P
P. Muhmenthaler, D Y. Zorian, USA
Organizing Committee:

A. Rueda - Finance
G. Huertas - Proceedings
D. Vazquez - Local Arrangement
E. Peralias &
A. Acosta - Registration
G. Leger - Audio/visual
S. Sanchez - Web

Preliminary Call for Papers

The IEEE European Test Symposium (ETS) is Europe¡¯s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2009, ETS will take place in the nice town of Seville, Andaluc¨ªa, in southern Spain. ETS¡¯09 is being organized by Instituto de Microelectr¨®nica de Sevilla (CSIC and Univ. de Sevilla), and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.
You are invited to participate and submit your contributions to ETS¡¯09. The areas of interest of ETS¡¯09 include (but are not limited to) the following topics:

Automatic Test Generation
Fault Modeling and Simulation
Current-Based Test
Power Issues in Test
Thermal Test
Delay and Performance Test
High-Speed IO/Interconnect Test
Signal Integrity Test
Nanometer Technologies Test
ATE Hardware and Software
Standards in Testing
Test(ability) Synthesis
Built-In Self Test (BIST)
Design for Test(ability) (DfT)
Test Data Compression
On-Line Test
Self-Repair Methodologies
Test of Reconfigurable Systems
Analog, Mixed-Signal, RF Test
Memory Test and Repair
Microprocessor Test
GALS Test
MEMS Test
Digital Power Supply Testing
Failure Analysis
Diagnosis and Debug
Design Verification and Validation
Lifetime Test
Test Quality and Reliability
Yield Analysis and Enhancement
Defect and Fault Tolerance
Board and System Test
Embedded Systems Test
High-Level DfT and TPG
System-on-Chip (SoC) Test
System-in-Package (SiP) Test


Publications ¨C ETS¡¯09 will produce a Formal Proceedings, published by the IEEE Computer Society, and a Web-Based Electronic Informal Digest of the selected papers. The best contributions will be selected for submission to regular issues of the ¡°Journal of Electronic Testing: Theory and Applications¡± (JETTA), published by Springer. ETS¡¯09 will present a Best Paper Award at ETS¡¯10.



Submissions ¨C ETS¡¯09 seeks original, unpublished contributions of the following types:

Scientific papers, presenting novel and complete research work
Workshop-type papers, including emerging ideas and practical case studies
Vendor Session presentations, focusing on new features of test-related products
Proposals for panels, embedded tutorials, and other special sessions.
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS web page.

IEEE TTTC Test Technology Educational Program (TTEP) tutorials on test technology topics will be offered during ETS¡¯09. Tutorial proposals should be submitted according to TTEP 2009 submission deadlines (http://computer.org/tab/tttc/teg/ttep).

As a new initiative for ETS¡¯09, a Ph.D. Forum will be organized. Moreover, the ETS¡¯09 organizing committee would like to encourage the organization of fringe workshops and will provide extensive support for the organization of such events. Full details can be found on the ETS web page.

Key Dates:

¡¤ Submission deadline: December 7, 2008
¡¤ Notification of acceptance: February 16, 2009
¡¤ Camera-ready manuscript : March 16, 2009

Further Information:

Jos¨¦ Lu¨ªs Huertas ¨C General Chair
IMSE-CNM, Univ. Sevilla
Avda. Reina Mercedes S/N
41012 Sevilla, Spain
Tel.: +34-95-505-6666
Fax: +34-95-505-6692
Email: huertas-AT-imse.cnm.es





J. Paulo Teixeira ¨C Program Chair
IST, Tech. Univ. Lisbon, INESC-ID
R. Alves Redol, 9
1000-029 Lisboa, Portugal
Tel.: +351-21 31 00 254
Fax: +351-21 314 58 43
E-mail: paulo.teixeira-AT-ist.utl.pt



Visit the ETS web page at: http://www.ieee-ets.org