ECMFA-TW 2010 - Sixth ECMFA Traceability Workshop (ECMFA-TW 2010)
Topics/Call fo Papers
CALL FOR PAPERS: 6th ECMFA Traceability Workshop (ECMFA-TW 2010)
Traceability is an important theoretical and practical challenge in Model Based Engineering (MBE). Traceability mechanisms are needed in processes involving automatic model to model transformations, in text/code generation, and in manual modelling activities, as well as in end-to-end traceability scenarios. We are facing challenges of keeping models consistently synchronised, models and text/code in consistent states, and mixing manual updates with automatic processes.
The two first ECMDA Traceability workshops focused mainly on theoretical and technical aspects of traceability, and concluded that many of the theoretical and technical challenges of traceability are well understood. As a result, the workshop focus was shifted more towards applications of traceability in industrial settings.
There are still unsolved theoretical and technical issues of traceability. However, still the most important limitation is the availability of tools to support full traceability and proofs of real usage of traceability in MBE.
Therefore, we especially invite papers presenting practical solutions that address traceability issues, as well as papers that present traceability tool solutions. We also seek papers that address how and when traceability information should be added, how it should be kept up-to-date, and how, when and for what purposes it can be used. These and other issues of traceability in MBE that have a strong practical focus are all good topics for papers submitted to the workshop.
- Tools supporting traceability of model and code artifacts
- Industrial case studies
- Practical applications and experience with traceability
- How, when and for what purposes traceability information should/can be added
- Novel theoretical and technical approaches to handle model-based traceabilty
Other topics on traceability in model-based development are also welcomed.
* SUBMISSION
We ask for papers from 4-8 pages following the ACM International Conference Proceedings Template
http://www.acm.org/sigs/publications/proceedings-t... .
Please read the Information for ACM authors on the ACM web site.
Each paper will be reviewed by three members of the programme committee.
Please send a PDF-version of your paper to goran.k.olsen |at| sintef.no
* PUBLICATION
Proceedings will be published in the ACM International Conference Proceedings Series with assigned ISBN/ISSN.
* IMPORTANT DATES
Submission of papers: April 1st 2010 Extended: deadline April 9th 2010
Notification of authors: May 4th 2010
Camera-ready copies of accepted papers: May 18th 2010
Workshop date: June 15th 2010
* ORGANISING COMMITTEE
Jon Oldevik, SINTEF, Norway
Gøran K. Olsen, SINTEF, Norway
Dimitrios Kolovos, Univ. of York, UK
* PROGRAMME COMMITTEE
Stefan Van Baelen, K.U.Leuven, Belgium
Mariano Belaunde, France Telecom, France
Ivan Kurtev, Univ. of Twente, The Netherlands
Miguel de Miguel, Universidad Politecnica de Madrid (UPM), Spain
Patrik Nandorf, Ericsson, Sweeden
Bjorn Nordmoen, WesternGeco, Norway
Richard Paige, Univ. of York, UK
Tom Ritter, Fraunhofer FOKUS, Germany
Andreas Rummler, SAP Research, Germany
Mirko Seifert, Univ. of Dresden, Germany
Ståle Walderhaug, SINTEF, Norway
Traceability is an important theoretical and practical challenge in Model Based Engineering (MBE). Traceability mechanisms are needed in processes involving automatic model to model transformations, in text/code generation, and in manual modelling activities, as well as in end-to-end traceability scenarios. We are facing challenges of keeping models consistently synchronised, models and text/code in consistent states, and mixing manual updates with automatic processes.
The two first ECMDA Traceability workshops focused mainly on theoretical and technical aspects of traceability, and concluded that many of the theoretical and technical challenges of traceability are well understood. As a result, the workshop focus was shifted more towards applications of traceability in industrial settings.
There are still unsolved theoretical and technical issues of traceability. However, still the most important limitation is the availability of tools to support full traceability and proofs of real usage of traceability in MBE.
Therefore, we especially invite papers presenting practical solutions that address traceability issues, as well as papers that present traceability tool solutions. We also seek papers that address how and when traceability information should be added, how it should be kept up-to-date, and how, when and for what purposes it can be used. These and other issues of traceability in MBE that have a strong practical focus are all good topics for papers submitted to the workshop.
- Tools supporting traceability of model and code artifacts
- Industrial case studies
- Practical applications and experience with traceability
- How, when and for what purposes traceability information should/can be added
- Novel theoretical and technical approaches to handle model-based traceabilty
Other topics on traceability in model-based development are also welcomed.
* SUBMISSION
We ask for papers from 4-8 pages following the ACM International Conference Proceedings Template
http://www.acm.org/sigs/publications/proceedings-t... .
Please read the Information for ACM authors on the ACM web site.
Each paper will be reviewed by three members of the programme committee.
Please send a PDF-version of your paper to goran.k.olsen |at| sintef.no
* PUBLICATION
Proceedings will be published in the ACM International Conference Proceedings Series with assigned ISBN/ISSN.
* IMPORTANT DATES
Submission of papers: April 1st 2010 Extended: deadline April 9th 2010
Notification of authors: May 4th 2010
Camera-ready copies of accepted papers: May 18th 2010
Workshop date: June 15th 2010
* ORGANISING COMMITTEE
Jon Oldevik, SINTEF, Norway
Gøran K. Olsen, SINTEF, Norway
Dimitrios Kolovos, Univ. of York, UK
* PROGRAMME COMMITTEE
Stefan Van Baelen, K.U.Leuven, Belgium
Mariano Belaunde, France Telecom, France
Ivan Kurtev, Univ. of Twente, The Netherlands
Miguel de Miguel, Universidad Politecnica de Madrid (UPM), Spain
Patrik Nandorf, Ericsson, Sweeden
Bjorn Nordmoen, WesternGeco, Norway
Richard Paige, Univ. of York, UK
Tom Ritter, Fraunhofer FOKUS, Germany
Andreas Rummler, SAP Research, Germany
Mirko Seifert, Univ. of Dresden, Germany
Ståle Walderhaug, SINTEF, Norway
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Last modified: 2010-06-04 19:32:22