ICN+T 2014 - 2014 International Conference on Nanoscience + Technology (ICN+T)

The 2014 International Conference on Nanoscience + Technology (ICN+T) will provide an international forum for discussion of the latest developments in nanoscale science and technology and recent advances in scanning probe microscopy and related techniques. The ICN+T represents the convergence of the former International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano, which were first combined in Basel, Switzerland in 2006. (List of the former meeting sites.) This conference will cover a range of topics in nanoscale science and technology, addressing the interdisciplinary, international nature of this exciting and rapidly growing field. Topics to be covered include scanning probe microscopy/spectroscopy and related instrumentation, nanosystems, nanomechanics, nanomanipulation, nanomagnetism, nanooptics, nanowires, nanofluidics, nanobiotechnology, molecular electronics, quantum devices, and advances in materials and processing for nanotechnology and nanofabrication.
HikingLeading scientists will give approximately 50 plenary and invited presentations on the latest developments in nanoscale science and technology. We expect 600-700 attendees from around the globe to present their latest research.
In addition to a diverse technical program, vendors will exhibit the latest equipment available for nanoscale measurement science and technology. The exhibit will surround the poster presentations, providing many opportunities for discussions between attendees and vendors.
We look forward to seeing you at ICN+T 2014 and welcoming you to the beautiful Vail Cascade in the Colorado Rocky Mountains. We encourage participants to arrive a day or two early to enjoy the surrounding area while getting accustomed to the high altitude (above 2700 m).