MDMAN 2014 - Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale

Constant advances in manufacturing yield and field reliability are important enabling factors for electronic devices pervading our lives, from medical to consumer electronics, from railways to the automotive and avionics scenarios. At the same time, both technology and architectures are today at a turning point; many ideas are being proposed to postpone the end of Moore’s law such as extending CMOS technology as well as finding alternatives to it like CNTFET, QCA, memristors, etc., while at the architectural level, the spin towards higher frequencies and aggressive dynamic instruction scheduling has been replaced by the trend of including many simpler cores on a single die. These paradigm shifts imply new dependability issues and thus require a rethinking of design, manufacturing, testing, and validation of reliable next-generation systems. These manufacturability and dependability issues will be resolved efficiently only if a cross-layer approach that takes into account technology, circuit and architectural aspects will be developed.
This workshop will provide an open forum for presentations in the above-mentioned fields. The topics of interest include (but are not limited to):
Methodologies/techniques for manufacturing reliable nanoscale devices
System level design, on-line testing/fault tolerance
Verification and Validation/Debug Methodologies
Fault tolerance for space applications
Fault tolerance for transportation systems
Fault tolerance for medical devices
Paper submission
Perspective authors are invited to submit an abstract, maximum 4 pages, prepared according to the Springer format. Detailed information about the submission process will be made available on the workshop web page.
Paper publication and Presenter Registration
Accepted abstracts will be distributed during the workshop and published on the Workshop’s website. Every accepted paper must have at least one author registered to the workshop by the time the camera-ready is submitted; the author is also expected to attend the workshop and present the contribution. Extended versions of the accepted abstracts are also eligible to undergo a second round of reviews for possible publication in a special session of an archival journal.