ETS 2014 - 19th IEEE European Test Symposium
Date2014-05-26 - 2014-05-30
Deadline2013-12-01
VenuePaderborn, Germany
Keywords
Websitehttps://www.ets14.de
Topics/Call fo Papers
The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing. In 2014, ETS will take place in the Heinz Nixdorf Forum in Paderborn. It is organized by the University of Paderborn, which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA) and the Test Technology Technical Council (TTTC). ETS also features a special track on Emerging Test Strategies (ETS2), where new problems and ideas can be discussed in an informal atmosphere. A Test Spring School will be organized in conjunction with ETS’14.
You are invited to participate and submit your contributions to ETS’14. The areas of interest include (but are not limited to) the following topics:
Analog Test
ATE Hardware and Software
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Current-Based Test
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DFT)
Design Verification and Validation
Diagnosis and Silicon Debug
Economics of Test
Failure Analysis
Fault Modeling and Simulation
Fault Tolerance
High-Speed I/0 Test
Low-Power IC Test
Memory Test and Repair
MEMS Test
Microprocessor Test
Mixed-Signal Test
Nanotechnology Test
On-line Test
Power Issues in Test
Reliability
RF Test
Security Issues in Test
Self-Repair
Signal Integrity Test
Stacked or 3D ICs Test
Standards in Test
System Test
SiP and SoC Test
Test Synthesis
Test of Reconfigurable Systems
Test Quality
Thermal Issues in Test
Transient and Soft Errors
Yield Analysis and Enhancement
Publications
ETS’14 will produce Formal Proceedings of scientific papers. The best contributions will be selected for submission to regular issues of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Springer and IEEE Design & Test of Computers. The Best Paper Award of ETS’14 will be presented at ETS’15.
Submissions
ETS’14 seeks original, unpublished contributions of the following types:
Scientific papers for the Formal Proceedings, presenting novel and complete research work.
Contributions for the special track on Emerging Test Strategies.
Proposals for panels, embedded tutorials, and other special sessions.
Vendor presentations focusing on new features of test related products.
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted. The ETS’14 organizing committee strongly encourages the organization of fringe meetings and workshops.
Key Dates
Submission deadline: December 1, 2013
Notification of acceptance: February 14, 2014
Camera-ready manuscript: March 21, 2014
You are invited to participate and submit your contributions to ETS’14. The areas of interest include (but are not limited to) the following topics:
Analog Test
ATE Hardware and Software
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Current-Based Test
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DFT)
Design Verification and Validation
Diagnosis and Silicon Debug
Economics of Test
Failure Analysis
Fault Modeling and Simulation
Fault Tolerance
High-Speed I/0 Test
Low-Power IC Test
Memory Test and Repair
MEMS Test
Microprocessor Test
Mixed-Signal Test
Nanotechnology Test
On-line Test
Power Issues in Test
Reliability
RF Test
Security Issues in Test
Self-Repair
Signal Integrity Test
Stacked or 3D ICs Test
Standards in Test
System Test
SiP and SoC Test
Test Synthesis
Test of Reconfigurable Systems
Test Quality
Thermal Issues in Test
Transient and Soft Errors
Yield Analysis and Enhancement
Publications
ETS’14 will produce Formal Proceedings of scientific papers. The best contributions will be selected for submission to regular issues of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Springer and IEEE Design & Test of Computers. The Best Paper Award of ETS’14 will be presented at ETS’15.
Submissions
ETS’14 seeks original, unpublished contributions of the following types:
Scientific papers for the Formal Proceedings, presenting novel and complete research work.
Contributions for the special track on Emerging Test Strategies.
Proposals for panels, embedded tutorials, and other special sessions.
Vendor presentations focusing on new features of test related products.
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted. The ETS’14 organizing committee strongly encourages the organization of fringe meetings and workshops.
Key Dates
Submission deadline: December 1, 2013
Notification of acceptance: February 14, 2014
Camera-ready manuscript: March 21, 2014
Other CFPs
Last modified: 2013-10-22 23:15:06