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IST 2013 - 2013 IEEE International Conference on Imaging Systems and Techniques (IST)

Date2013-10-22 - 2013-10-23

Deadline2013-07-20

VenueBeijing, China China

Keywords

Websitehttps://ist2013.ieee-ims.org

Topics/Call fo Papers

Following the success of events in Stresa in Italy 2004, Niagara Falls in Canada 2005, Minori in Italy 2006, Krakow in Poland 2007, Chania in Greece 2008, Shenzhen in China 2009, Thessaloniki in Greece 2010 Penang in Malaysia 2011 and Manchester in the UK 2012, the 2013 IEEE International Conference on Imaging Systems and Techniques (IST’2013) will take place in Beijing, China.
IST’2013 deals with the design, development, evaluation and applications of imaging systems, instrumentation, and measuring techniques, to enhance detection and image quality. Applications for aerospace, medicine and biology, molecular imaging, metrology, Ladars and Lidars, radars, homeland security, and industrial imaging, with emphasis on industrial and medical tomography, corrosion imaging, and non-destructive evaluation (NDE), will be covered. The following areas will be particularly considered:
Aerospace imaging
Remote sensing, passive and active sensing
Ladars and Lidars
Polarimetric Imaging
Multi-spectral polarimetric imaging and Lasers
Medical Imaging
Computer Tomography (CT), Single Photon Emission Tomography (SPECT)
Positron Emission Tomography (PET), Magnetic Resonance Imaging (MRI)
Molecular and metabolic imaging
Cancer detection and imaging of margins
Electric Impedance Tomography
Environmental monitoring, energy resources
Real-time imaging and video processing
Subsurface inspection, corrosion imaging
Airport security and cargo inspection
Electromagnetic imaging and inverse scattering
Image analysis and processing
Pattern recognition and feature extraction
Image transformations
Statistical description of images
Wavelets and fractals
Image enhancement and restoration
Image segmentation and edge detection
Image processing for multispectral images
With emphasis on:
Detector design principles and image formation
Imaging system design and instrumentation
Signal and image analysis
Pre-processing and post-processing
Multi-functional and multi-fusion imaging
Emerging trends on imaging

Last modified: 2013-10-01 23:02:57