FOI 2013 - 1st EOS Topical Meeting on Frontiers in Optical Imaging (FOI 2013)
Topics/Call fo Papers
Optical imaging methods play a key role in many fields of science, engineering and in a huge number of everyday applications. FOI 2013 focuses on the most relevant and most challenging of these techniques, with the purpose of advancing the state-of-the-art in domains where the fundamental limits of imaging performance have not yet been achieved. By combining novel physical detection principles, advanced sensor chip and electronic circuit design, new optical imaging methods, mathematical algorithms for image reconstruction and physical techniques to improve image resolution, the frontiers of optical imaging are further pushed back.
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Topics
Advanced microscopic techniques, including near-field methods
Single-photon imaging
Mid-infrared spectroscopy and imaging (2-12 ?m)
Polarization based imaging techniques
High-speed time-gated and time-resolved imaging
High-resolution fluorescence imaging
Advanced X-ray imaging (e.g. phase contrast, time-of-flight, energy-resolved)
Physical super-resolution techniques (STORM, STED, PALM, structured illumination)
Numerical super-resolution techniques (e.g. blind deconvolution)
Imaging in scattering media
3D optical imaging (OCT, interferometry, time-of-flight)
Non-linear optical imaging
Quantum imaging
Novel contrast mechanism for imaging
Wavefront and temporal shaping for imaging
Programme Committee
Joseph Braat, Delft University of Technology (NL)
Bart Dierickx, Free University of Brussels (BE)
Christian Eggeling, University of Oxford (UK)
Sylvain Gigan, Institute Langevin (FR)
Franco Gori, Università di Roma (IT)
Hans Peter Herzig, École Polytechnique Fédérale de Lausanne - EPFL (CH)
Alain Jutant, Nikkoia SAS (FR)
Philippe Réfrégier, Institut Fresnel (FR)
Volker Seyfried, Leica Microsystems (DE)
Jacob Stamnes, University of Bergen (NO)
Nicolas Treps, École Normale Supérieure - Paris (FR)
Michael Unser, École Polytechnique Fédérale de Lausanne - EPFL (CH)
Andreas Zumbusch, University of Konstanz (DE)
Invited Speakers
Christian Eggeling, University of Oxford (UK)
Ulf Leonhardt, Weizmann Institute of Science (IL)
Monika Ritsch-Marte, Medical University of Innsbruck (AT)
Yaron Silberberg, Weizmann Institute of Science (IL)
Renato Zenobi, ETH Zurich (CH)
top
Topics
Advanced microscopic techniques, including near-field methods
Single-photon imaging
Mid-infrared spectroscopy and imaging (2-12 ?m)
Polarization based imaging techniques
High-speed time-gated and time-resolved imaging
High-resolution fluorescence imaging
Advanced X-ray imaging (e.g. phase contrast, time-of-flight, energy-resolved)
Physical super-resolution techniques (STORM, STED, PALM, structured illumination)
Numerical super-resolution techniques (e.g. blind deconvolution)
Imaging in scattering media
3D optical imaging (OCT, interferometry, time-of-flight)
Non-linear optical imaging
Quantum imaging
Novel contrast mechanism for imaging
Wavefront and temporal shaping for imaging
Programme Committee
Joseph Braat, Delft University of Technology (NL)
Bart Dierickx, Free University of Brussels (BE)
Christian Eggeling, University of Oxford (UK)
Sylvain Gigan, Institute Langevin (FR)
Franco Gori, Università di Roma (IT)
Hans Peter Herzig, École Polytechnique Fédérale de Lausanne - EPFL (CH)
Alain Jutant, Nikkoia SAS (FR)
Philippe Réfrégier, Institut Fresnel (FR)
Volker Seyfried, Leica Microsystems (DE)
Jacob Stamnes, University of Bergen (NO)
Nicolas Treps, École Normale Supérieure - Paris (FR)
Michael Unser, École Polytechnique Fédérale de Lausanne - EPFL (CH)
Andreas Zumbusch, University of Konstanz (DE)
Invited Speakers
Christian Eggeling, University of Oxford (UK)
Ulf Leonhardt, Weizmann Institute of Science (IL)
Monika Ritsch-Marte, Medical University of Innsbruck (AT)
Yaron Silberberg, Weizmann Institute of Science (IL)
Renato Zenobi, ETH Zurich (CH)
Other CFPs
- 5th EOS Topical Meeting on Optical Microsystems (O?S'13)
- 1st EOS Topical Meeting on Optics at the Nanoscale (ONS'13)
- The 4th International Conference on Learning Analytics & Knowledge
- 6th IEEE/ACM International Conference on Utility and Cloud Computing
- International Conference on Applied Science, Technology and Management
Last modified: 2013-06-25 00:19:43