ISICT 2012 - IEEE International Symposium on Instrumentation and Control Technology

The 8th IEEE International Symposium on Instrumentation and Control Technology
ISICT 2012 will be held at the University of Westminster in London, United Kingdom, 11-13 July 2012.
The 8th IEEE International Symposium on Instrumentation and Control Technology (ISICT 2012) provides an established forum for scientists and engineers on the field of Instrumentation and Control Technology to meet and exchange information about novel and emergent development, applications in Measurement, Sensors, Instrumentation and Control Technology areas.
Building upon the success of the 1st-7th ISICT series conferences over the last decade, The 8th IEEE International Symposium on Instrumentation and Control Technology will take place in city of London, the first city to officially host the modern Olympic Games three times. Like the celebration of the Olympic Games encompasses many rituals and symbols, the ISICT 2012 shall continue the tradition of bringing together top specialists in the broad area of Measurement, Sensors, Instrumentation, Computer Control Technology and allow participants from all over the world to celebrate and enjoy the incomparable platform for knowledge mining, idea exchanging and collaboration discussing.
All submitted papers to ISICT 2012 will be thoroughly reviewed for possible inclusion in the Conference Proceedings. Proceedings of the symposium will be published by IEEE and indexed by EI. Papers are invited in English only, including but not limited to the following related topics:
? Sensors and Instruments
MEMS Sensors
Nanosensors and Instruments
Biosensors/Arrays
Smart sensors and standards (IEEE 1451.X)
Virtual sensors and Instruments
? Signal Acquisition, Analysis and Processing
Data Acquisition
Data mining and fusion
Digital Signal Processing
Machine Vision and related
? Measurement Theory and Technology
Uncertainty Theories and Applications
Industrial Measurement
Electronic/Biological/Medical Measurement Techniques
On-line Monitoring of Dynamic Processes
? Opto-electronics Technology and Instruments
Opto-Electronic Testing
Opto-Electronic Instruments
Modern Optical Instruments
Fiber-Optical Sensors and Technology
? Measurement Systems
Automated test & diagnostics systems
Fault-tolerant & resilient measurement systems
Machine Vision
Virtual measurement systems
Bus, Network and Reliability
? Control Theory and Automation
Control Theories and Application
Intelligent and Fault Tolerance Control
Integration Technologies of Automatic Test System
Industrial Automation
Decision-making Robot Control
? Computer Simulation, Modeling
Modeling & Simulation Technology
Inverse problems & signal reconstruction
Signal detection & classification
Hardware and Software in Simulation
Knowledge Acquisition and Expression
? Artificial Intelligence and Expert System
Robot
System Supervision and Maintenance
Intelligent Systems
Soft computing and Software Applications
Pattern Recognition and Identification
? Space Exploration
Remote sensing and telemetry
Advanced Navigation Technologies
Inertial instruments
Space Robotics
In-situ measurement
Control of Spacecraft