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ISIC 2010 - 2010 IEEE Multi-Conference on Systems and Control (MSC)

Date2010-09-08

Deadline2010-01-31

VenueYokohama, Japan Japan

Keywords

Websitehttp://www.mei.titech.ac.jp/msc10/

Topics/Call fo Papers

The 2010 IEEE Multi-conference on Systems and Control (MSC) gathers up three of the major international conferences promoted by the IEEE Control Systems Society: the International Conference on Control Applications (CCA), the International Symposium on Computer-Aided Control System Design (CACSD), the International Symposium on Intelligent Control (ISIC).

The 2010 IEEE Multi-Conference on Systems and Control (MSC), to be held at the PACIFICO YOKOHOMA, Japan, September 8-10, 2010, is comprised of three major international conferences promoted by the IEEE Control Systems Society:
the IEEE Conference on Control Applications (CCA), initiated in 1992, with the goal of bringing together experts from academy and industry from different countries to present new research results in control applications, promoting and encouraging industrial participation in the activities of the IEEE Control Systems Society;
the IEEE International Symposium on Computer-Aided Control System Design (CACSD), initiated in 1992 to be a place for discussion and promotion of the new developments of algorithms and software tools to be used as enabling technologies in control engineering, has evolved so to comprise all the different computational aspects of control system design. The 2010 CACSD Symposium will host a special track on Systems with Uncertainty;
the IEEE International Symposium on Intelligent Control (ISIC), initiated in 1985, provides a unique opportunity for researchers and practitioners from different areas to discuss innovative control algorithms, also developed by emulating certain characteristics of intelligent biological systems, and recent advancements in computing technology, that may open avenues for significant technological advances.
The conference will feature several kinds of presentations including contributed and invited papers as well as invited tutorial sessions and workshops, covering a broad range of topics relevant to control applications, methods, and development tools.

Last modified: 2010-06-04 19:32:22