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IPFA 2012 - 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

Date2012-07-02

Deadline2012-01-18

VenueSingapore, Singapore Singapore

Keywords

Websitehttps://ewh.ieee.org/reg/10/ipfa

Topics/Call fo Papers

IPFA 2012 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

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Last modified: 2011-09-09 12:16:14