THERMINIC 2011 - 2011 17th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Topics/Call fo Papers
THERMINIC Workshops are a series of events to discuss the essential thermal questions of microelectronic microstructures and electronic parts in general. These questions are becoming more and more crucial with the increasing element density of circuits packaged together and with the move to nanotechnology. These trends are calling for thermal simulation, monitoring and cooling. Thermal management is expected to become an increasingly dominating factor of a system’s cost. The growing power dissipated in a package, the mobile parts of microsystems raise new thermal problems to be solved in the near future necessitating the regular discussion of the experts in these fields. Finally, there is an increasing need for accurate assessment of the boundary conditions used in the analysis of electronic parts, which requires a concurrent solution of the thermal behaviour of the whole system.
This year THERMINIC will address in addition to the "traditional" thermal management problems, also stress and thermal-stress-related-reliability issues, both in micro- and opto-electronics fields. These issues, including various nanotechnology applications, are of significant importance and of high interest to the engineering community engaged in the field of thermal phenomena in "high-tech" systems.
The Workshop is sponsored by the IEEE Components, Packaging, and Manufacturing Technology Society and by CMP.
AREAS OF INTEREST include, but are not limited to, the following topics:
Thermal and Temperature Sensors
Measurement of Thermal Properties
Thermal Simulation
Acquisition and analysis of Thermal data
Electro-thermal Simulation
Temperature Mapping
Thermal Modelling Investigation of Packages
Novel and Advanced Cooling Techniques
Reliability Issues
Thermal Performance of Interconnects
High Temperature Electronics
Heat Transfer Enhancement
Heat Transfer Education
Validation of Thermal Software
Flow Visualisation Techniques
Coupled Thermo-mechanical, Thermo- optical, etc.) Effects
Turbulence Modelling in Complex Geometrics
Thermal Stress: Theory and Experiment
Defect and failure modelling
Thermal Stress Failures: Prediction and Prevention
Reliability evolution and prediction
Nanotechnology Applications
Multiphysics simulation
Noice control
Nanoengineering issues
3DIC, power electronics
Education
This year THERMINIC will address in addition to the "traditional" thermal management problems, also stress and thermal-stress-related-reliability issues, both in micro- and opto-electronics fields. These issues, including various nanotechnology applications, are of significant importance and of high interest to the engineering community engaged in the field of thermal phenomena in "high-tech" systems.
The Workshop is sponsored by the IEEE Components, Packaging, and Manufacturing Technology Society and by CMP.
AREAS OF INTEREST include, but are not limited to, the following topics:
Thermal and Temperature Sensors
Measurement of Thermal Properties
Thermal Simulation
Acquisition and analysis of Thermal data
Electro-thermal Simulation
Temperature Mapping
Thermal Modelling Investigation of Packages
Novel and Advanced Cooling Techniques
Reliability Issues
Thermal Performance of Interconnects
High Temperature Electronics
Heat Transfer Enhancement
Heat Transfer Education
Validation of Thermal Software
Flow Visualisation Techniques
Coupled Thermo-mechanical, Thermo- optical, etc.) Effects
Turbulence Modelling in Complex Geometrics
Thermal Stress: Theory and Experiment
Defect and failure modelling
Thermal Stress Failures: Prediction and Prevention
Reliability evolution and prediction
Nanotechnology Applications
Multiphysics simulation
Noice control
Nanoengineering issues
3DIC, power electronics
Education
Other CFPs
- 2011 Electromagnetic Compatibility Symposium (EMCSA)
- 2011 7th Asia-Pacific International Conference on Lightning (APL)
- 2012 IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications
- 2012 IEEE First AESS European Conference on Satellite Telecommunications (ESTEL)
- 2011 IEEE 19th Annual Symposium on High-Performance Interconnects (HOTI)
Last modified: 2011-04-10 20:15:12