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CPS 2019 - 2019 Workshop on Monitoring and Testing for Cyber-Physical Systems

Date2019-04-15

Deadline2019-01-31

VenueMontréal, Canada Canada

Keywords

Websitehttps://sites.google.com/berkeley.edu/mt-cps2019

Topics/Call fo Papers

Cyber-physical systems (CPS) model the integration of computational modules, like decision logic, with physical phenomena in the environment, such as the phenomenon being controlled by the logic. Several CPS applications, such as self-driving cars and other autonomous ground/aerial/underwater vehicles, medical devices, surgical robots, as well as many Internet of Things (IoT) applications, particularly for Industrial IoT or Industry 4.0, are safety-critical, where human lives can be at stake. CPS exhibit complex and unpredictable behaviors, thus making their correctness and robustness analysis a challenging task. Given the gap between the complexity of such systems and the scalability of current formal methods, exhaustive formal verification remains an elusive goal. However, simulation-based lightweight verification techniques, such as monitoring and testing, achieve both rigor and efficiency by enabling the evaluation of systems according to the properties of their exemplar behaviors. The Workshop on Monitoring and Testing of Cyber-Physical Systems (MT-CPS) aims to bring together researchers and practitioners interested in the problems of detecting, testing, measuring, and extracting qualitative and quantitative properties from individual behaviors of CPS.
Topics of interest include (but are not limited to):
■ Specification languages for monitoring and testing
■ Runtime verification and monitoring of CPS
■ Model/Software/Hardware/Processor-in-the-loop (MIL/SIL/HIL/PIL) testing
■ Testing the integration of heterogeneous components
■ Monitoring and testing of streaming and/or historical IoT data
■ Interpretation of multi-dimensional counter-examples
■ Black-box and white-box testing
■ Measuring and statistical information gathering for data-driven analyses
■ Simulation-based verification and parameter synthesis
■ Fault diagnostics, localization, and recovery
■ Combination of static and dynamic analysis
■ Applications and case studies from safety-critical domains

Last modified: 2019-03-10 23:32:03