EOS/ESD 2012 - 2012 34th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

Sponsored by the ESD Association in cooperation with the IEEE
Technically co-sponsored by the Electron Devices Society
For further information, please see contact details on the next page.
Papers are solicited in the following areas:
I. Component Level EOS/ESD
? On-Chip Protection Devices & Techniques
? EOS/ESD Failure Analysis
? ESD Device and Circuit Simulation
? IC Design and Layout Issues
? Transmission Line Pulse and Other Testing Methods
? Modeling and Physics of EOS/ESD
? ESD & Latchup, or other Reliability Aspects
? Processing Issues and Effects
? RF Devices and Circuits
? ESD in Advanced Technologies (Multi-gate, SOI, SiGe, Compound Semiconductors, Carbon Nano-tubes, etc.)
? New ESD Phenomena in MEMS (Microelectromechanical Systems)
? High Voltage, High Power Technologies (BiCMOS, HV CMOS)
II. System Level EOS/ESD
? Simulators, Calibration and Correlation
? Case Studies, Reviews and Analysis
? Optical Networks ESD
? Test Methods and Procedures
? ESD Detection and Measurement Techniques
? Modeling and Simulation
? ESD Electronic Design Automation (EDA)
Ill. EOS/ESD Factory Level and Materials Technology
? Packaging and Handling
? Case Studies, Reviews and Analysis
? Test Methods and Procedures
? Transient ESD/EMI Induced Upset
? Air Ionization and Uses
? Troubleshooting Techniques
? Facility Design
? Management Issues (cost/benefit analyses, etc.)
? ESD Control Materials
? ESD Shunting Packaging Technology
? Use of Antistatic Materials
? Chemistry
IV. Electrostatic Considerations
? Biomedical & Chemical Industry Electrostatic Control
? Graphic Arts Electrostatic Control
? ESD Control in Explosives and Pyrotechnics
? Oil/Petroleum Industry Electrostatic Control
? Aircraft, Spacecraft and Avionics ESD
? Other ESD Topics
V. Magnetic Recording Heads and Ultra Sensitive Devices
? Testing and Analysis
? Protection Techniques
? Special Considerations for Extremely Sensitive Devices
? Failure Analysis Techniques and Interpretations
VI. ESD Standards ? Components, System, Factory & Materials
? Test Methods and Procedures
? Round-Robin Testing, Results and Analysis
? Standards - Comparisons and Analysis
? Case Studies