HCS 2011 - 2011 IEEE Hot Chips 23 Symposium (HCS)
Date2011-08-01
Deadline2011-03-22
VenuePalo Alto, USA - United States
Keywords
Websitehttps://www.hotchips.org
Topics/Call fo Papers
Since it started in 1989, HOT CHIPS has been known as one of the semiconductor industry's leading conferences on high-performance microprocessors and related integrated circuits. The conference is held once a year in August on the Stanford University campus in the center of the world's capital of electronics activity, Silicon Valley. The conference emphasis this year, as in previous years, is on real products and realizable technology. Topics of particular interest include:
General Purpose Processor Chips
Low-Power
High-Performance
Multi-Core, Multi-Processor Technologies: interconnects, programming models, compilers, runtime systems
Other Chips
Novel Technology: Quantum Computing, Nano-Structures, Micro-Arrays, On-chip Optics
Low-power chips/Dynamic Power Management
Communication/Networking
Chipsets
Wireless LAN/Wireless WAN
FPGAs and FPGA-based Systems
Display Technology
Application-Specific/Embedded Processors
System-on-Chip
Mobile Phone
Digital Signal Processing
Network/Security
Graphics/Multimedia/Game
Software
Compiler technology
Operating System/Chip Interaction
Performance Evaluation
Other Technologies
Advanced Package Technology
Reliability and Design for Test
General Purpose Processor Chips
Low-Power
High-Performance
Multi-Core, Multi-Processor Technologies: interconnects, programming models, compilers, runtime systems
Other Chips
Novel Technology: Quantum Computing, Nano-Structures, Micro-Arrays, On-chip Optics
Low-power chips/Dynamic Power Management
Communication/Networking
Chipsets
Wireless LAN/Wireless WAN
FPGAs and FPGA-based Systems
Display Technology
Application-Specific/Embedded Processors
System-on-Chip
Mobile Phone
Digital Signal Processing
Network/Security
Graphics/Multimedia/Game
Software
Compiler technology
Operating System/Chip Interaction
Performance Evaluation
Other Technologies
Advanced Package Technology
Reliability and Design for Test
Other CFPs
Last modified: 2010-12-03 13:14:17