IMSTW 2018 - International Mixed-Signal Testing Workshop
Date2018-07-02 - 2018-07-04
Deadline2018-03-11
VenueHotel Cap Roig, Platja d’Aro, Catalonia, Spain
Keywords
Topics/Call fo Papers
IEEE forum addressing these techniques in the context of mixed-signal circuits:
Self-healing, self-repair, and self-adaptation
Design-for-manufacturing
Design-for-yield
Dependability
Fault tolerance
Reliability and design-for-reliability
On-line test
Hardware security and trust
Functional safety
Verification and silicon debugging
Design-for-test
Built-in self-test
Failure analysis
Fault diagnosis
Fault modeling and simulation
Test generation
CAD tools for robust system design and test
Self-healing, self-repair, and self-adaptation
Design-for-manufacturing
Design-for-yield
Dependability
Fault tolerance
Reliability and design-for-reliability
On-line test
Hardware security and trust
Functional safety
Verification and silicon debugging
Design-for-test
Built-in self-test
Failure analysis
Fault diagnosis
Fault modeling and simulation
Test generation
CAD tools for robust system design and test
Other CFPs
- 3rd IEEE Federative Event on Design for Robustness
- 24th IEEE International Symposium on On-Line Testing and Robust System Design
- 24th International Conference on Electrical Engineering (ICEE 2018)
- Next-Generation Wireless Networks Meet Advanced Machine Learning Applications
- First Financial Narrative Processing Workshop (FNP 2018)
Last modified: 2017-12-07 13:17:21