ResearchBib Share Your Research, Maximize Your Social Impacts
Sign for Notice Everyday Sign up >> Login

VLSID 2018 - 31st International Conference on VLSI Design (VLSID 2018)

Date2018-01-06 - 2018-01-10

Deadline2017-08-07

VenuePune, Maharashtra, India India

Keywords

Websitehttps://embeddedandvlsidesignconference.org

Topics/Call fo Papers

Theme: Safe and Secure Intelligent Systems
Call for Papers
 
This joint conference is a forum for researchers and designers to present and discuss current topics in VLSI design, electronic design automation, embedded systems, and emerging technologies. Two days of tutorials will be followed by three days of regular paper sessions, special sessions, and embedded tutorials. Industry presentation sessions along with exhibits, panel discussions, Design Contest, and Education Forum round off the program. The conference is followed by the Reliability Aware System Design and Test (RASDAT) workshop.
 
TOPICS OF INTEREST: Papers are invited on previously unpublished results in the following categories:
 
EMBEDDED SYSTEMS DESIGN
E1: Embedded Systems Hardware: HW/SW co-design, SoC, multi-core systems, board level hardware, HW security, Internet-of-Things (IoT) devices, sensors/actuators, displays.
E2: Embedded Systems Software: Operating systems, firmware, algorithms, middleware, runtimes, parallelization, virtualization, software for low power, security, reliability, real-time support, emerging applications (e.g., automotive, telematics, analytics).
E3: FPGA and Reconfigurable Systems: FPGA architecture and FPGA circuit design, CAD for FPGA, FPGA prototyping, FPGA-based accelerators.
E4: Wireless Systems: Sensor networks, low-power wireless systems, wireless protocols, wireless power delivery.
E5: Embedded Case Studies: Practical and industrial tools, methodologies, designs in various application areas: wireless, medical, networking, multimedia, automotive, controls, etc.
 
DESIGN TOOLS AND EDA
T1: Design Verification: Functional, formal, coverage-driven, hardware-assisted, and assertion-based verification, behavioral, RTL, and gate-level simulation, emulation, equivalence checking.
T2: Test, Reliability, Fault-Tolerance: DFT, fault modelling and simulation, ATPG, BIST, repair, delay test, fault tolerance, online test, AIMS/RF test, board-level and system-level test, silicon debug, post-silicon validation, memory test, reliability testing.
T3: Computer-Aided Design(CAD)tools: Logic and behavioral synthesis, logic mapping, simulation and formal verification, layout (partitioning, placement, routing, floor planning and compaction), post route optimizations.
 
DESIGN METHODOLOGIES AND TECHNOLOGY
M1: System-level Design: methodologies and architectures, processor and memory design, multi-core, GPU design, networks-on-chip, defect-tolerant architectures, accelerators, distributed system (e.g., automotive), cyber-physical systems.
M2: Advances in Digital Design: Logic and physical synthesis, place and route, clock tree design, timing and signal integrity, design for manufacturability and yield, power integrity, variation-tolerant design.
M3: Analog, Mixed-Signal and RF Design: Design of analog, mixed signal, and RF IP, high-speed wired and wireless interfaces, low-power analog and RF.
M4: Power-Aware Design: Power analysis and estimation, optimization and low-power design, energy-efficient design, battery-aware design, thermal management, energy harvesting.
M5: CMOS Technology and Devices: Deep nanoscale CMOS devices, device modeling and simulation, multi-domain simulation, device/circuit level reliability and variability.
M6: Emerging Technologies: Post-CMOS devices, MEMS sensors, biomedical circuits, lab-on-chip, carbon nanotubes, silicon photonics, spintronic, memristors, neuromorphic and quantum computing.
 
SAFE & SAFE AND SECURE INTELLIGENT SYSTEMS
S1: Design for Safety and Relibility: Physically unclonable functions, random number generators, fault tolerance systems and architectures.
S2: Secure Circuits and Systems: System security, side channel attacks and anti-piracy methodologies, Embedded systems security in healthcare, automotive, industrial and IoT applications.
S3: Safety Assurance of Circuits/ Systems: Design for functional safety and certifications in airborne, health care, automotive systems.
 
EMBEDDED TUTORIALS AND SPECIAL SESSIONS: Proposals in relevant emerging areas should be submitted as two-page abstracts. On acceptance, authors are required to submit full regular papers.
HALF-DAY AND FULL-DAY TUTORIALS: The ES 2018 and VLSID 2018 technical program will feature both half-day and full-day Tutorials to be held on the first two days of the conference. Tutorial proposals are invited for full-day and half-day tutorials that present current topics in Embedded Systems, VLSI Design and Test, EDA and related fields. Tutorials should focus on established or emerging research topics within the field itself, but we also welcome tutorials from related research fields or application areas. The ideal tutorial should attract a wide audience, be broad to provide a gentle introduction to the chosen research area, and should also cover the most important contributions in depth. Proposals that exclusively focus on the presenter’s own work or commercial presentations are not eligible.
Tutorial Proposal Guidelines
A tutorial proposal must include the following information:
1. Length of the Tutorial (half-day or full day)
2. Title of the Topic, Names and Affiliations of the Author(s)
3. List of lecturer(s) who will be presenting the tutorial
4. Extended Abstract (up to 2 pages only)
5. Table of contents and break-down of the Tutorial (as detailed as possible) up to 2 pages. The tutorial is not a report on scientific activity of the author(s), and we recommend that the tutorial content is divides in four parts: a) the review of the ideas which spawned the tutorial topic (25%), the review of the main publications which established the tutorial field (25%), the review of the scientific work of authors in the field of tutorial (25%), and the review of the main directions in the future development of tutorial field (25%).
6. List of the main references (books, papers, including the work of authors, not more than 1 page) pertaining to the tutorial topic. As applicable, indicate books which can be used as the tutorial textbook(s).
7. Detailed list of Publications/Patents by Author(s) on the topic of the tutorial.
8. Experience in offering tutorials
9. Detailed Biography of lecturer(s).
Conference Tutorial (Half-day and Full-Day) Dates: Saturday January 6, 2018 and Sunday January 7, 2018
PANELS: Proposals must be submitted with an abstract, and a list of panelists.
SUBMISSIONS: All submissions should be made electronically via the conference website by July 16, 2017. Your manuscript should clearly state the novelideas, results, and applications of the contribution. Paper submissions will undergo a double-blind review. Papers must be in PDF format and not exceed 6 single-spaced pages including figures and references in two-column IEEE conference paper format. Papers exceeding the page limit or identifying the authors will be rejected without review.
EXHIBITS: Please contact the Exhibits Chair to explore opportunities to display your products/services.
FELLOWSHIPS: The conference will award fellowships, based on need and merit, to partially cover expenses of attendees from India. Application details will be posted at the conference website.
DESIGN CONTEST: Please check the conference website or contact the Design Contest Chair for more details.
USER TRACK AND PHD FORUM: Please check the conference website for details on criteria and submission dates.

Last modified: 2017-06-25 07:22:48