ITC 2012 - IEEE International Test Conference (ITC2012)

ITC, the cornerstone of the Test Week event, is known worldwide for the strength of its technical program, which attracts many top researchers and industry experts who choose ITC to present the results of their work. Offerings throughout the week incorporate a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, lecture series sessions, advanced industrial practices sessions, a poster session, workshops, commercial exhibits and a host of professional fringe meetings. Taken together, these activities provide a week-long educational experience that will benefit people new to testing and experts.

Last year, the International Test Conference technical program together with other Test Week 2012 events focused on breakthrough ideas to address the challenges of providing high-quality, cost-effective tests for IC, boards and systems. The program focused on the latest advances in such hot topics as design for manufacturability, power-aware test, recent advances in delay test, logic diagnosis, silicon debug, and high-quality test methods. Attendees learned more about what’s going on in traditional topics such as analog, mixed-signal, RF, microprocessor test and DFT ? as well as defects, memory, ATE and board test.

ITC also continued its tradition of presenting thought-provoking panels exploring current issues challenging the test practitioner.