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AUTOTESTCON 2017 - IEEE Systems Readiness Technology Conference
Date2017-09-11 - 2017-09-14
Deadline2017-03-15
VenueSchaumburg, Illinois, USA - United States 
Keywords
Websitehttps://2017.autotestcon.com
Topics/Call fo Papers
The committee is now soliciting abstracts. All submissions should cover appropriate topics dealing with system readiness in general and automatic test technology in particular. View the detailed Call for Papers and abstract specifications on the IEEE AUTOTESTCON website: http://autotestcon.com
TOPICS INCLUDE
* Performance Based Logistics
* Factory and Development Test
* Health Monitoring & Diagnostics
* Software Testing and Research
* Embedded Instrumentation
* Next Generation Test Systems
* Support Economics
* Legacy ATE Challenges
* Test & Support Management
IMPORTANT DATES
Abstract Submission: March 15, 2017
Acceptance Notification: May 5, 2017
Final Paper Deadline: July 31, 2017
TOPICS INCLUDE
* Performance Based Logistics
* Factory and Development Test
* Health Monitoring & Diagnostics
* Software Testing and Research
* Embedded Instrumentation
* Next Generation Test Systems
* Support Economics
* Legacy ATE Challenges
* Test & Support Management
IMPORTANT DATES
Abstract Submission: March 15, 2017
Acceptance Notification: May 5, 2017
Final Paper Deadline: July 31, 2017
Other CFPs
- International Symposium on Performance Evaluation of Computer and Telecommunication Systems
- 1st Workshop of Open Domain Action Recognition (ODAR)
- 1st ACM Workshop on Research Reproducibility
- 16th IEEE International Conference on Machine Learning and Applications
- Joint EURO/ORSC/ECCO Conference 2017 on Combinatorial Optimization (ECCO XXX)
Last modified: 2017-03-11 12:33:41