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CFSE 2016 - 8th IEEE International Workshop on Computer Forensics in Software Engineering

Date2016-06-10 - 2016-06-14

Deadline2015-12-30

VenueAtlanta, USA - United States USA - United States

Keywords

Websitehttps://staging.computer.org/web/compsac2016/cfse

Topics/Call fo Papers

Computer forensics has been an emerging research area for IT-related professionals, researchers, and practitioners since the turn of the century. As we continue the research on how to collect and analyze digital evidence in an existing software/hardware environment, we also encourage the discussion on the "built-in" issues in how to design and build software/hardware applications with forensic awareness so that a more supportive environment for the purpose of computer/digital forensics is provided.
Theme and Scope of the Workshop
The theme of the workshop is to advance research on a legal-activity-enforced cyber environment in an innovative way. We believe that to build forensics into software/hardware applications will help us more efficiently in collecting/identifying evidence of illegal activities, more effectively in preventing/detecting cyber attacks on critical infrastructures, and more confidently in preserving/promoting anonymity and privacy.
In addition to the study of "after the fact" issues on collection, examination, and analysis of digital evidence, it is critical to involve computer forensic readiness in an early stage of software/hardware application development. As the principles of software engineering suggest, the effort to build forensics "by design" will make cyberspace more supportive and cost-effective in a later forensic search and investigation.
Topics of interest include but are not limited to:
Anti Software Forensics
Big Data Forensics / Big Data Analytics in Computer/Digital Forensice
Business (Workflow) Process Forensics
Case studies in all related areas
Cloud Forensics / Fog Forensics
Code Authorship Analysis or Code-theft Detection
Compiler Forensics / Formal Methods in Forensic Computing
Computer/Digital Forensics Education and Curriculum Development
Electronic Discovery
IoT forensics
Forensic Programming and Software Development
Forensic Readiness in Software Engineering / Forensics by Design
Forensic Testing / Cyber Crime Simulation
Forensics in Embedded and Real Time Systems
Game / Virtual World Forensics
Image Forensics / Information Hiding Technology
Legal, Ethical and Privacy Issues in Computing
Network Forensics
Next Generation and Evolution of Computer Forensics
SCADA / Critical Infrastructure Forensics
Social Computing Forensics
Software Application Forensics (Medical, Financial, Governmental, etc.)
Software Forensics and Profiling
Source Code Forensic Recovering
System Software Forensics
Ubiquitous/Mobile/iPhone Forensic Computing
Visualization of Computer/Digital Forensics
Web Services/SOA/XML Forensics
Workflow/Business Process Forensics
The length of a camera ready paper will be limited to 6 pages (IEEE Proceedings style) with up to 2 additional pages (with charges for each additional page) printed on 10-12 point fonts. Authors must follow IEEE CS Press Proceedings Author Guidelines to prepare papers. At least one of the authors of each accepted paper is required to pay full registration fee and present the paper at the workshop in person.
Program Committee
Yuki Ashino, NEC, Japan
Vinod Bhattathiripad, G J Software Forensics, India
Rong Chen, Dalian Maritime University, China
Fred Cohen, California Sciences Institute, USA
Ryan Hankins, Dell Inc., USA
Shuhui Hou, University of Science & Technology, China
Satoshi Kai, Hitachi Ltd., Japan
Rethabile Khutlang, SCIR, South Africa
Chu-Hsing Lin, Tunghai University, Taiwan
Anyi Liu, Purdue University, USA
Masakatsu Nishigaki, Shizuoka University, Japan
Wei Ren, China University of Geosciences, China
Sean Thorpe, University of Technology, Jamaica
Michael Tu, Purdue Univesrity of Calumet, USA
Ben Turnbull, Defense Science and Technology, Australia
Shiuh-Jeng Wang, Central Police University, Taiwan
Rongsheng Xu, Chinese Academy of Sciences, China
Chung-Huang Yang, Kaohsiung Normal University, Taiwan
S.M. Yiu, The University of Hong Kong, China
Hiroshi Yoshiura, The University of Electro-Comm., Japan
Yanjun Zuo, University of North Dakota, USA

Last modified: 2015-12-27 22:02:30