IDT 2015 - 10th IEEE International Design & Test Symposium (IDT’15)

The International Design and Test Symposium is an IEEE-sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design, test, automation, and reliability of electronic systems ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems. IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test, and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE TTTC (Test Technology Technical Council) and the 2015 edition is organized and sponsored by JUST (Jordan University of Science & Technology) and AAU (Amman Arab University) in collaboration with JCP (Jordan Competitiveness Program). It is also technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to:
Topics
Design Methods and Tools
IP and SOC Design
Multiprocessor/Multi-core Systems
Embedded Systems
DFX
Analog, Mixed Signal and RF Design
High Speed Circuits Design
Design of MEMS and MOEMS
Low Voltage and Low Power systems
Innovative Technologies
Real Time Systems
Simulation, Validation & Verification
System Specification and Modeling
Formal Methods and Verification
System Design/Synthesis/Optimization
Test and Reliability
Yield Learning
IP and SOC Testing
Multiprocessor/Multi-Core Systems Test
Memory & FPGA Test & Repair
Delay Testing
High Speed, Analog, Mixed Signal & RF Testing
MEMS/MOEMS Testing
Defect and Fault Modeling
DFT, BIST and BISR
On-line Testing / Fault Tolerance
Fault Simulation, ATPG
Reliability Failures/ Modeling
Circuit Reliability
Electronic System Reliability