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EIW 2015 - Extreme Imaging Workshop

Date2015-12-17 - 2015-12-18

Deadline2015-08-16

VenueSantiago de, Chile Chile

Keywords

Websitehttp://extremeimaging.csail.mit.edu

Topics/Call fo Papers

As imaging matures and computing power increases, a new set of methodologies and imaging modalities are emerging that can be labeled as “Extreme.” The characterization “extreme” stems from system or processing considerations relative to time scale, spatial extent, object size, processing speed, unconventional environments and data size. An interesting attribute of extreme imaging approaches is that once they become better understood and used in applications, they enter the mainstream and are no longer considered extreme. One of the objectives of this workshop is to bring to the forefront such promising approaches and accelerate their development by engaging a larger portion of the community. Another objective of the workshop is to push the limits of imaging and computer vision research to areas, modalities and systems that have not yet been explored.
Several key topics are:
Imaging at extreme time scales: ultrafast to super slow
Imaging at extreme size scales--microscopy or astronomy
Imaging using extreme data sets
Imaging in harsh or unconventional environments
Imaging using extreme optical configurations
Applications of extreme imaging

Last modified: 2015-07-30 22:13:39