HASE 2010 - The 12th IEEE International High Assurance Systems Engineering Symposium (HASE 2010)

The 12th IEEE International High Assurance Systems Engineering Symposium
(HASE) http://web.mst.edu/~hase/hase2010/index.html

Co-Located with the 21st IEEE International Symposium on Software
Reliability Engineering (ISSRE) http://www.issre2010.org/

November 1-4, 2010
San Jose, CA, USA

Call for Contributions

The IEEE International Symposium on High Assurance Systems Engineering
is a forum for discussion of systems and software engineering approaches
to achieving high assurance systems. The focus is on integrated
approaches for assuring reliability, availability, integrity, privacy,
confidentiality, safety, and real-time performance of complex systems;
and methods for assessing assurance levels of these systems to a high
degree of confidence. Technical and experience papers on algorithms,
policies, middleware, tools, and models for high assurance systems
development, verification and validation, and assessment are welcome.

Topics of interest for the symposium include, but are not limited to:

* Design and development of highly reliable, survivable, secure, safe,
and time-assured systems
* Integrated system reliability, availability, security, safety, and
timing analysis and evaluation methods
* Formal specification, validation, testing, and model checking for high
assurance systems
* High assurance software architectures and design
* Transformation-based and evolutionary-based system development
* Reconfigurable system design for evolving high assurance requirements
* Dynamic monitoring and adaptation for run-time assurance
* High assurance information/knowledge systems and data grids
* High assurance embedded systems, ubiquitous systems, and sensor
networks
* High assurance web services
* Extending web service specifications for reliability, safety,
security, privacy and other QoS properties
* Case studies, experiments, and tools for high assurance systems

Research Papers:
HASE 2010 is soliciting original, unpublished research papers. The
length is limited to 10 pages, in IEEE style.

Fast Abstracts:
A fast abstract is a lightly reviewed, two-page technical article that
requires a short talk at HASE. The length is limited to two pages, in
IEEE style.

All submissions must be written in English and formatted according to
the IEEE formatting guidelines for conference papers.

All papers and fast abstracts must be submitted through the web-based
submission system, in PDF format. At least one author of each accepted
research paper or fast abstract is required to pay the full registration
fee to the conference.

Each accepted paper or fast abstract must be presented in person by the
author or one of the authors.

Panel Proposals:
Proposals for panels are being solicited. Panel proposals should be
submitted by email, to sedighs-AT-mst.edu, and should include the panel
title and scope, and organizers' contact information.

Important Dates:
July 5, 2010 Abstract registration deadline
July 12, 2010 Full paper submission deadline
July 30, 2010 Fast abstract and panel proposal deadline
August 16, 2010 Author notification
August 30, 2010 Camera-ready submission and author registration
deadline

General Inquiries:
For more detailed information, please visit the symposium website at:
http://web.mst.edu/~hase/hase2010/index.html

For further information or inquiries, please contact:
Sahra Sedigh, Program Chair of HASE 2010 (sedighs-AT-mst.edu)