CMI 2016 - 2016 IEEE First International Conference on Control, Measurement and Instrumentation (CMI 2016)

CMI 2016 will be the first biennial flagship event of IEEE Joint CSS-IMS Chapter, Kolkata Section, India. This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications. CMI 2016 will comprise keynote and plenary sessions by eminent academicians, regular and poster sessions of contributed papers, special sessions and tutorial sessions. All papers will undergo blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance. All accepted papers presented at the conference will be submitted for publication in IEEE Xplore (approval pending) and will be published in the conference proceedings with an IEEE catalog number and ISBN number. Authors are invited to submit their papers not exceeding 5 pages in IEEE format. At least one author of each accepted paper must register for the conference and present his/her paper.