FMSPLE 2015 - 6th Formal Methods and Analysis in Software Product Line Engineering (FMSPLE)

Software product line engineering (SPLE) aims to develop a family of systems through systematic, large-scale reuse in order to reduce time-to-market and costs and to increase product quality. Formal methods and analyses offer promising techniques towards realizing these goals. While some analysis approaches (e.g., for feature modelling and variant management) and formal methods (e.g., BDDs, CSPs, SAT solvers, model checkers and formal semantics of variability models) have been applied to SPLE, a considerable potential remains to be exploited. This workshop brings together researchers and practitioners interested in raising the efficiency and the effectiveness of SPLE by applying innovative analysis approaches and formal methods. Participants will be invited to review the state of the art and practice in their respective fields, identify further promising application areas, report practical requirements and constraints from real-world product lines, discuss drawbacks and complements of various approaches, or present new ideas and results.
Topics of interest include, but are not limited to:
Analysis approaches and formal methods for:
domain analysis and scoping
variability modeling
specification and verification of functional and non-functional properties in SPLE
safety and security aspects in SPLE
product line architectures and component-based product line development
product line implementation, such as type systems, programming languages, formal semantics
formal verification of product lines and product line artifacts
correctness-by-construction techniques in SPLE
automated test case generation and model-based testing in SPLE
product derivation and application engineering
product line life-cycle management (e.g., consistency assurance)
reuse and evolution of SPLs
Proofs of concept, industrial experiences and empirical evaluations
Tool presentations
Vision and position papers on formal methods and analyses applied to SPLE
Organisers: Joanne Atlee, U. Waterloo, Canada (jmatlee-AT-uwaterloo.ca) and Stefania Gnesi, ISTI/CNR, Pisa, Italy (stefania.gnesi-AT-isti.cnr.it)