AUTOTESTCON 2012 - 2009 IEEE AUTOTESTCON

AUTOTESTCON is the world’s premier conference that brings together the military/aerospace automatic test industry and government/military acquirers and users to share new technologies, discuss innovative applications, and exhibit products and services. It is sponsored annually by the IEEE.

The Theme this year is Mission Assurance through Advanced ATE.

AUTOTESTCON will be held at the Disneyland Resort and Conference Center in Anaheim, California, on September 10-13, 2012. The TECHNICAL PROGRAM for AUTOTESTCON 2012 will be determined by the interests of those participants submitting for publication and presentation a TECHNICAL PAPER or organizing a TECHNICAL SESSION. Papers and sessions should cover appropriate topics dealing with SYSTEM READINESS in general and AUTOMATIC TEST technology in particular. ABSTRACTS for TECHNICAL PAPERS are now being solicited, as are proposals for TECHNICAL SESSIONS.

Important Aspects of Systems Readiness
Performance Based Logistics
Health Monitoring & Diagnostics
Embedded Instrumentation
Support Economics
Test & Support Management
We are seeking abstracts and Session proposals that explore these topics. We are also encouraging papers and sessions that address new and innovative approaches to systems maintenance and improved readiness and address topics such as:

Organizational/Intermediate/Depot Level Maintenance For The Future, Next-Generation Test Systems, Flexible Sustainment, Remote Testing, Interoperability, Design-For-Test & Built-in-test, Fault Tolerant Systems, Legacy ATE Challenges, Future Logistics Support Concepts, Contractor Logistics Support, Maintenance Repair & Overhaul, Multinational Integrated Support, Commercial Approaches to Military System Maintenance, CMMI Application to ATE/TPS Development, DMSMS Issues, Test Program Set Development, Prognostics & Diagnostics, System and Vehicle Health Maintenance, Test Requirements Definition and Verification, Factory and Development Test, and Research & Development in Instrumentation and Measurement.

In addition, we will conduct a Student Paper Awards program for both Graduate and Undergraduate student papers within the topic scope. There will be cash awards of $500 for Best papers in both categories, plus travel subsidies ranging from $300 to $1000 depending on student location. Student abstracts are to be submitted to the URL shown below and identified as Student Papers.

Abstracts are to be submitted to the Abstract Management website no later than February 15, 2012, at http://www.edas.info and submit to IEEE AUTOTESTCON 2012 on this site.

For Technical Program information contact:
Michael T. Ellis, Technical Program Chairman
Northrop Grumman Corp.
21240 Burbank Blvd.
Woodland Hills, CA 91367
(818) 715-2944
michael.t.ellis-AT-ngc.com

For other information contact:
Bob Rassa, General Chairman
Raytheon Company
2260 Engle Rd
Fallston MD 21047
(310) 985-4962
RCRassa-AT-raytheon.com

Sponsored by the IEEE Instrumentation & Measurement and IEEE Aerospace & Electric Systems Societies