ISMQC 2010 - International Symposium on Measurement and Quality Control (ISMQC 2010)
Topics/Call fo Papers
International Symposium on Measurement and Quality Control (ISMQC) is one of the most important scientific events that is normally held once in every two or four years in the field of measurements and quality control. The aim of the symposium is to present the evolution of manufacturing metrology & quality management, to spot their implication for science, industry & engineering and to highlight new techniques of measurement at the international level. It brings together researchers, developers and users to discuss theoretical and experimental research, their applications and future trends relevant to measurement, optical metrology and quality management.
ISMQC is supported by IMEKO-Technical Committee (TC14) on Measurement of Geometrical Quantities. The ISMQC series has been organized successfully eight times since its inception. The 10th ISMQC will be organized at Osaka University, Suita, Osaka, Japan, in September 2010. Special emphasis will be on innovative and quality research work and applied scientific results. Novel methods and technologies, intelligent measuring techniques in various fields of application, including Engineering, Science, Medicine, Biology etc. will also be covered. The symposium will provide an excellent opportunity for the presentation of the achievements and also provide a forum for interaction and exchange of ideas among participants from universities, leading research institutions, and industries from various parts of the globe. The symposium will provide a chance to share the 21st century technology and to develop effective cooperation between countries.
Symposium Scope
Topics
Papers, posters, and exhibitions are invited on the following aspects:
A Measurements for Dimensional, Geometrical and Mechanical Quantities in Manufacturing
A 1 Sensors, Components and Systems
* A 1.1 Machine Vision and Image Processing
* A 1.2 3D-Surface Texture and its Micro Characteristics
* A 1.3 CMM-Metrology
* A 1.4 Form Tester
* A 1.5 Gear Metrology
* A 1.6 Measurement of Motion Parameters
* A 1.7 Advanced Optoelectronic Sensors and Instruments
* A 1.8 Nonlinear Optical Instruments Applied for Industry
A 2 Metrology fields
* A 2.1 Macrogeometric features and characteristics
* A 2.2 Test Planning
* A 2.3 Machine tool metrology
* A 2.4 Webbased Metrology Services
A 3 Strategies and Methods
* A 3.1 Measurement Equipment Monitoring and Metrological Self-Diagnostics
* A 3.2 Accreditation of Calibration Laboratories
* A 3.3 New Education and Training Methods
A 4 Measurement Evaluation and Verification
* A 4.1 Uncertainty Evaluation and Traceability
* A 4.2 Metrology Software and Software Evaluation
* A 4.3 Geometrical Product Specifications and Verification (GPS)
* A 4.4 Tolerancing, Testing, Evaluation
A 5 Intelligent Measurement
* A 5.1 Intelligent Micro- and Nano-Metrology
* A 5.2 Intelligent Measurement Algorithm and Simulation
* A 5.3 Intelligent Nano Positioning
* A 5.4 Intelligent Calibration and Testing Methods for Measurement Equipment
* A 5.5 Pre-, In- and Post-Process Measurement
* A 5.6 Optical Measurement for Geometrical Quantity Evaluation
* A 5.7 X-ray Application for 3-D Measurement
* A 5.8 Nano Photonics for Intelligent Measurement
* A 5.9 Novel Methods for Medical and Biological Measurement
* A 5.10 MEMS/MOEMS Application in Measurement Field
B Quality Control for Geometrical Quantities
B 1 Quality Control Strategies and Methods
* B 1.1 Quality Planning
* B 1.2 Quality Control Loops
* B 1.3 Quality-databased Systems, Quality-data-Exchange
* B 1.4 Knowledge based Quality-Methods
B 2 Managing Quality Control
* B 2.1 Measurement of Quality, Quality gates
* B 2.2 Audits and Certification
* B 2.3 Quality management in distributed manufacturing systems
* B 2.4 Networks for Quality Management
* B 2.5 Quality-Improvement
* B 2.6 Education and Training
ISMQC is supported by IMEKO-Technical Committee (TC14) on Measurement of Geometrical Quantities. The ISMQC series has been organized successfully eight times since its inception. The 10th ISMQC will be organized at Osaka University, Suita, Osaka, Japan, in September 2010. Special emphasis will be on innovative and quality research work and applied scientific results. Novel methods and technologies, intelligent measuring techniques in various fields of application, including Engineering, Science, Medicine, Biology etc. will also be covered. The symposium will provide an excellent opportunity for the presentation of the achievements and also provide a forum for interaction and exchange of ideas among participants from universities, leading research institutions, and industries from various parts of the globe. The symposium will provide a chance to share the 21st century technology and to develop effective cooperation between countries.
Symposium Scope
Topics
Papers, posters, and exhibitions are invited on the following aspects:
A Measurements for Dimensional, Geometrical and Mechanical Quantities in Manufacturing
A 1 Sensors, Components and Systems
* A 1.1 Machine Vision and Image Processing
* A 1.2 3D-Surface Texture and its Micro Characteristics
* A 1.3 CMM-Metrology
* A 1.4 Form Tester
* A 1.5 Gear Metrology
* A 1.6 Measurement of Motion Parameters
* A 1.7 Advanced Optoelectronic Sensors and Instruments
* A 1.8 Nonlinear Optical Instruments Applied for Industry
A 2 Metrology fields
* A 2.1 Macrogeometric features and characteristics
* A 2.2 Test Planning
* A 2.3 Machine tool metrology
* A 2.4 Webbased Metrology Services
A 3 Strategies and Methods
* A 3.1 Measurement Equipment Monitoring and Metrological Self-Diagnostics
* A 3.2 Accreditation of Calibration Laboratories
* A 3.3 New Education and Training Methods
A 4 Measurement Evaluation and Verification
* A 4.1 Uncertainty Evaluation and Traceability
* A 4.2 Metrology Software and Software Evaluation
* A 4.3 Geometrical Product Specifications and Verification (GPS)
* A 4.4 Tolerancing, Testing, Evaluation
A 5 Intelligent Measurement
* A 5.1 Intelligent Micro- and Nano-Metrology
* A 5.2 Intelligent Measurement Algorithm and Simulation
* A 5.3 Intelligent Nano Positioning
* A 5.4 Intelligent Calibration and Testing Methods for Measurement Equipment
* A 5.5 Pre-, In- and Post-Process Measurement
* A 5.6 Optical Measurement for Geometrical Quantity Evaluation
* A 5.7 X-ray Application for 3-D Measurement
* A 5.8 Nano Photonics for Intelligent Measurement
* A 5.9 Novel Methods for Medical and Biological Measurement
* A 5.10 MEMS/MOEMS Application in Measurement Field
B Quality Control for Geometrical Quantities
B 1 Quality Control Strategies and Methods
* B 1.1 Quality Planning
* B 1.2 Quality Control Loops
* B 1.3 Quality-databased Systems, Quality-data-Exchange
* B 1.4 Knowledge based Quality-Methods
B 2 Managing Quality Control
* B 2.1 Measurement of Quality, Quality gates
* B 2.2 Audits and Certification
* B 2.3 Quality management in distributed manufacturing systems
* B 2.4 Networks for Quality Management
* B 2.5 Quality-Improvement
* B 2.6 Education and Training
Other CFPs
Last modified: 2010-06-04 19:32:22