IDT 2013 - 8th IEEE International Design and Test Symposium

The International Design and Test Symposium (IDT) explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems and microsystems. IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) and the 2013 edition is organized by The Delft University of Technology and technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English.