DATE 2014 - 17th Design, Automation and Test in Europe Conference

The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-ofthe-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, such as automotive, wireless, telecom and multimedia applications. The organization of user group meetings, fringe meetings, a university booth, a PhD forum, vendor presentations and social events offers a wide
variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results. More details are given on the DATE website (www.date-conference.com).
Areas of Interest
Within the scope of the conference, the main areas of interest are: embedded systems, design methodologies, CAD languages, algorithms and
tools, testing of electronic circuits and systems, embedded software, applications design and industrial design experiences. Topics of interest
include, but are not restricted to:
? System Specification and Modeling
? System Design, Synthesis and Optimization
? Simulation and Validation
? Design of Low Power Systems
? Power Estimation and Optimization
? Emerging Technologies, Systems and Applications
? Formal Methods and Verification
? Network on Chip
? Architectural and Microarchitectural Design
? Architectural and High-Level Synthesis
? Reconfigurable Computing
? Logic and Technology Dependent Synthesis for Deep-Submicron Circuits
? Physical Design and Verification
? Analogue and Mixed-Signal Circuits and Systems
? Interconnect, EMC, EMD and Packaging Modeling
? Computing Systems
? Communication, Consumer and Multimedia Systems
? Transportation Systems
? Medical and Healthcare Systems
? Energy Generation, Recovery and Management Systems
? Secure, Dependable and Adaptive Systems
? Test for Defects, Variability, and Reliability
? Test Generation, Simulation and Diagnosis
? Test for Mixed-Signal, Analog, RF, MEMS
? Test Access, Design-for-Test, Test Compression, System Test
? On-Line Testing and Fault Tolerance
? Real-time, Networked and Dependable Systems
? Compilers and Code Generation for Embedded Systems; Software-centric System Design Exploration
? Model-based Design and Verification for Embedded Systems
? Embedded Software Architectures and Principles; Software for MPSoC, Multi/many-core and GPU-based Systems "