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DCIS 2013 - 28th Conference on Design of Circuits and Integrated Systems

Date2013-11-27 - 2013-11-29

Deadline2013-04-19

VenueDonostia, Spain Spain

Keywords

Websitehttps://www.ceit.es/dcis/

Topics/Call fo Papers

The Conference on Design of Circuits and Integrated Systems (DCIS) is an important international meeting for researches in the highly active fields of micro and nano electronics circuits and integrated systems. It provides an excellent forum to present and investigate the emerging challenges in modeling, design, implementation and test of circuits and systems.
The 28th edition of DCIS will be held in DONOSTIA-SAN SEBASTIAN, located in the Basque Country. This "small" big city has touches of the Belle Époque (Golden Age) and a top-flight cultural agenda with its international film and jazz festivals and its first-class cultural programme.
More than that, San Sebastian is the world capital of the pintxo. Gastronomy rivals nature as the most attractive feature of this city that's world famous for its cuisine and chefs, and boasts 16 Michelin stars.
Researchers from industry and academia are invited to submit papers reporting recent achievements and on-going works in all domains of micro and nano-electronics, embedded systems, enabling technologies and tools. Topics to be discussed include, but are not limited to:
Integrated Systems Design
RF ICs
Network-On-Chip
HW-SW Codesign
Low Power Design
Bioinspired Systems
Biomedical Electronics
Reconfigurable Computing
Embedded Design & SoC
Digital Signal Processing
System Design Methodologies
Modeling, Simulation and Synthesis
Analog and Digital IC Design
System Technology
Packaging
MEMS and MOEMS
Integrated Sensors & Actuators
Organic and Post-silicon Electronics
Nano-electronics/fabrication/structures
Programmable Devices
System Applications
Smart Grids
Industrial Applications
Electric Car Networking
Communication Systems
Smart Objects & Wireless Applications
Smart Ambient Assisted Living
Power Electronics - Devices & Systems
Testing
Modeling and Simulation
Failure Analysis and Reliability
Built-In Self Test and Calibration
Analogue and RF Test and DfT
Digital Test and DfT
Defect and Fault Tolerance Techniques

Last modified: 2013-03-13 23:13:38