CMSC 2013 - 2013 The Coordinate Metrology Systems Conference

The CMS Announces our “Call for Papers" for the 2013 CMSC in San Diego, CA
The World's Premier Conference for Measurement Technology Professionals
The Coordinate Metrology Systems Conference (CMSC) provides a professional venue where ideas, concepts and theory flow freely among participants. The educational atmosphere encourages attendees to network and learn about the latest innovations in the field of portable 3D industrial measurement technologies. We will provide technical presentations by Industry Experts, advanced Workshops and Seminars along with an Exhibition Hall filled with the worlds leading providers of the metrology systems.
2013 CMSC Technical Paper Guidelines
Coordinate Metrology Systems Conference
The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, today announced their "Call for Papers" for the 2013 Coordinate Metrology Systems Conference (CMSC). The 29th annual event will be held at The Sheraton San Diego Hotel and Marina in San Diego, CA from July 22 - 26, 2013.
Quality Digest "CALL FOR PAPERS" video featuring Michael Raphael: http://www.youtube.com/watch?v=SSaQpeMUOq4&noredir...
The organization welcomes abstracts for presentations and technical papers submitted by metrology professionals from leading manufacturers, science laboratories, and academia. Suggested topics include industry best practices, scientific research and developments, and successful applications of 3D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.
Important Deadlines for Submission and Publication:
Abstract Submission Deadline . . . . . . . . . . . . . . . . . . March 15, 2013
Notification of Acceptance . . . . . . . . . . . . . . . . . . . April 1, 2013
Technical Papers Due . . . . . . . . . . . . . . . . . . . . . . June 1, 2013
Presentations Due. . . . . . . . . . . . . . . . . . . . . . . . July 1, 2013
Final Paper/Presentation Revisions Deadline . . . . . . . . . . .July 15, 2013
CMSC Conference Dates . . . . . . . . . . . . . . . . . . . . . .July 22 - 26, 2013
Benefits of Presenting at the Coordinate Metrology Systems Conference (CMSC):
The benefits of presenting at the annual Coordinate Metrology System Conference are three-fold:
1)Presenting provides a tremendous opportunity for exposure and recognition by your peers in the field of coordinate metrology.
2)The Executive Committee waives the conference registration and membership fees for individuals presenting at the annual conference. (NOTE: In the case of presentations where there are multiple authors or contributors, the Executive Committee is only able to waive one conference registration and membership fee.)
3)The Coordinate Metrology Society will publish both technical papers and presentations on the CMSC website. Additionally, peer-selected technical papers will be published in The Journal of the CMSC,which is mailed to a large circulation, and distributed at trade shows or conferences that influence participation at the annual CMSC.
For more information about our 2013 CMSC “Call for Papers,” contact Michael Raphael, Technical Presentations Coordinator at presentations-AT-cmsc.org.
Abstract Guidelines
For a complete list of submission guidelines for the abstracts, technical papers, and presentations, please download the 2013 CMSC Technical Paper Guidelines from the website: www.cmsc.org
At CMSC 2012, 26 expert presentations were delivered by industry leaders from The Boeing Company, GKN Aerospace, NIST, Lockheed Martin, Hitachi Engineering & Services, ISRO Satellite Centre, Clemson University, Argonne National Laboratory, Schneider-Electric, Dassault Systemes, U.S. Army Research Laboratory, U.S. Navy Reverse Engineering Laboratory, National Research Council of Canada, Leibniz University Hannover, and other companies and educational institutions covering technology, theory, and practice to advance the field of 3D metrology.