ICTM 2009 - 2009 International Conference on Test and Measurement (ICTM 2009)
Date2009-12-05
Deadline2009-11-05
VenueHongKong, Hong Kong SAR
Keywords
Websitehttps://www.ictm2009.cn/
Topics/Call fo Papers
ICTM 2009 is a leading Asia-Pacific Conference on Test and Measurement (ICTM 2009).
2009 International Conference on Test and Measurement (ICTM 2009) will be held in Hong Kong, December 5-6, 2009
We are delighted to invite you to participate in 2009 International Conference on Test and Measurement in Hong Kong, December 5-6, 2009.The objective of ICTM 2009 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Test and Measurement to disseminate their latest research results and exchange views on the future research directions of these fields.
ICTM 2009 Proceedings has been published by IEEE, All accepted paper will be published by IEEE, Which will be indexed by EI Compendex and ISTP
ICTM 2009 Submssion System, The paper submission date is Nov 5, 2009
https://www.easychair.org/login.cgi?conf=ictm2009
ICTM 2009 已??入IEEE 官方会?列表
http://www.ieee.org/web/conferences/search/
所有?用?文被IEEE 出版,被EI 和ISTP ?索。?文集会前出版。
The conference provides an interdisciplinary forum for exchanging views on education, educational technologies, engineering education etc... Papers are solicited in the following and related areas:
★ Test theories and its application
★ Acoustic and ultrasonic measurement
★ ADC,DAC and data acquisition
★ Artificial intelligence ,nerve net work
★ Electronic -magnetic measurement
★ Environment measurement
★ Flow distribution and visualization
★ Image and information processing
★ Laser and optics fiber
★ Light and radiation detection
★ Mechanical measurement
★ MEMS and NEMS
★ Microwave measurement
★ Noise and vibration measurement
★ Nondestructive testing
★ On-line test
★ Remote sensing and telemeter
★ Robotics
★ Sensors and transducers
★ Industrial autoimmunization
★ Control theories and technologies
★ Automatic adjustment and measurement
★ Others
Sponsored and Supported
IEEE
IEEE Instrumentation and Measurement Society
Intelligent Information Technology Application Research Association, Hong Kong
Wuhan Institute of Technology, China
2009 International Conference on Test and Measurement (ICTM 2009) will be held in Hong Kong, December 5-6, 2009
We are delighted to invite you to participate in 2009 International Conference on Test and Measurement in Hong Kong, December 5-6, 2009.The objective of ICTM 2009 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Test and Measurement to disseminate their latest research results and exchange views on the future research directions of these fields.
ICTM 2009 Proceedings has been published by IEEE, All accepted paper will be published by IEEE, Which will be indexed by EI Compendex and ISTP
ICTM 2009 Submssion System, The paper submission date is Nov 5, 2009
https://www.easychair.org/login.cgi?conf=ictm2009
ICTM 2009 已??入IEEE 官方会?列表
http://www.ieee.org/web/conferences/search/
所有?用?文被IEEE 出版,被EI 和ISTP ?索。?文集会前出版。
The conference provides an interdisciplinary forum for exchanging views on education, educational technologies, engineering education etc... Papers are solicited in the following and related areas:
★ Test theories and its application
★ Acoustic and ultrasonic measurement
★ ADC,DAC and data acquisition
★ Artificial intelligence ,nerve net work
★ Electronic -magnetic measurement
★ Environment measurement
★ Flow distribution and visualization
★ Image and information processing
★ Laser and optics fiber
★ Light and radiation detection
★ Mechanical measurement
★ MEMS and NEMS
★ Microwave measurement
★ Noise and vibration measurement
★ Nondestructive testing
★ On-line test
★ Remote sensing and telemeter
★ Robotics
★ Sensors and transducers
★ Industrial autoimmunization
★ Control theories and technologies
★ Automatic adjustment and measurement
★ Others
Sponsored and Supported
IEEE
IEEE Instrumentation and Measurement Society
Intelligent Information Technology Application Research Association, Hong Kong
Wuhan Institute of Technology, China
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Last modified: 2010-06-04 19:32:22