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VTS 2013 - 2013 IEEE 31st VLSI Test Symposium (VTS)
Date2013-04-29
Deadline2012-10-19
VenueBerkeley, USA - United States 
Keywords
Websitehttps://www.tttc-vts.org
Topics/Call fo Papers
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2013. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
PROGRAM CHAIR
Yiorgos Makris
The University of Texas at Dallas
yiorgos.makris-AT-utdallas.edu
GENERAL CHAIR
Michel Renovell
LIRMM - University of Montpellier
renovell-AT-lirmm.fr
The VTS Program Committee invites original, unpublished paper submissions for VTS 2013. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
PROGRAM CHAIR
Yiorgos Makris
The University of Texas at Dallas
yiorgos.makris-AT-utdallas.edu
GENERAL CHAIR
Michel Renovell
LIRMM - University of Montpellier
renovell-AT-lirmm.fr
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Last modified: 2012-06-06 06:29:01