DATA 2012 - 2012 IEEE International Workshop on Defect and Adaptive Test Analysis (DATA)

The IEEE International Workshop on Defect & Adaptive Test Analysis (DATA 2012) is aimed at addressing the above issues. Paper presentations on topics related to the topics listed below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade.
? Outlier Identification
? Data-Driven Testing (DDT)
? Test Data Analysis
? Yield Learning and Analysis Using DDT
? Adaptive Test Database Requirements
? Data-Mining Methods for Test Data Processing
? High/Low Voltage Testing and Stress Testing
? Transition and Delay Fault Testing
? Reliability and Yield
? Nanometer Test Challenges
? Defect Coverage & Metrics
? Mixed Current/Voltage Testing
? Economics of Defect Based Testing
? Fault Localization & Diagnosis
? Noise and Crosstalk Testing
? In System or On-board Testing