ISMTII 2013 - The 11th International Symposium on Measurement Technology and Intelligent Instruments
- The 2nd International Conference on Intelligent Technology for Educational Applications (ITEA 2025)
- 8th International Conference on Measurement, Instrumentation, and Electronics(ICMIE 2025)
- 5th International Conference on Intelligent Technology and Embedded Systems (ICITES 2025)
- The 2nd International Conference on Intelligent Education and Computer Technology(IECT 2025)
- 2nd International Conference on Measurement, Communication and Virtual Reality(MCVR 2025)
Topics/Call fo Papers
Venue
The 11th ISMTII will take place in Aachen, Germany from July 1st until July 5th, 2013, hosted by RWTH Aachen University, Fraunhofer IPT and Physikalisch-Technische Bundesanstalt PTB.
We cordially invite you to participate in the upcoming event
with a manuscript and a talk about your research
by presenting your company and products at the accompanying exhibition
Scientific Scope
The conference will address the role of metrology in technical solutions facing global challenges. The sessions will therefore focus on but are not limited to the following topics:
- micro and nano metrology
e.g. for functional surfaces, nanostructures and surface textures
- macro metrology
e.g. as reference systems and for the measurement of large gearings - in-process and inline metrology
e.g. for the production of fiber-reinforced plastics components - Intelligent instruments for automation
e.g. self-optimizing systems and self-diagnostic systems - Sensors and actuators
e.g. for quality perception - Management of measurement processes
e.g. process planning, estimating measurement uncertainty, traceability, data and signal processing, modeling and simulation - Calibration and machine tool performance
e.g. for ultra-precision manufacturing and large volume manufacturing - Optical metrology
e.g. for semiconductor manufacturing and composites - Material characterization
e.g. hardness testing, computer tomography and ultrasound - Education and training in metrology
e.g. academic education, professional training and blended learning
The presentations will address applications in optical, medical, biotechnology, aerospace and production engineering industry
Other CFPs
Last modified: 2012-04-05 21:03:37