FOM 2010 - FOM 2010, Focus on Microscopy
Topics/Call fo Papers
This yearâ?™s conference in Krakow, Poland has been a great success. We want to thank the local organizers and especially Jurek Dobrucki for all the work that has gone into making FOM2009 both scientifically rewarding and at the same time an enjoyable conference it has been. The visit to the Salt Mine and the banquet at Folwark Zalesie resort were a beautiful conclusion of the conference.
You can view the abstracts of the in Krakow presented contributions under the 'History' button on the left and click 'FOM 2009' >> program. With the 'search' button you can in fact search all the contributions presented in the FOM conferences over the last five years.
It gives us great pleasure that we are able to announce that the next conference in the FOM series will take place in Shanghai, China from Sunday March 28 to Wednesday March 31, 2010. Please note that this is in the week before Easter 2010. The conference dinner and circus show will take place in the afternoon/evening of the last day of the conference, 31 March.
The conference will take place at the Shanghai Everbright Convention and Exhibition Center, in the center of Shanghai. Details of registration, abstract submission, deadlines, etc. will become available at a later moment on this website. When you wish to be kept informed please leave your email address here.
Focus on Microscopy 2010 is the continuation of a yearly conference series presenting the latest innovations in optical microscopy and their application in biology, medicine and the material sciences. Key subjects for the conference series are the theory and practice of 3D optical imaging, related 3D image processing, and reporting especially on developments in resolution and imaging modalities. The conference series is covers also the rapidly advancing fluorescence labeling techniques for the confocal and multi-photon 3D imaging of -live- biological specimens.
Typical topics of the upcoming FOM conference will include:
â?¢ Confocal and multiphoton-excitation microscopies â?¢ Novel illumination and detection strategies â?¢ Fluorescence - new labels, fluorescent proteins, quantum dots, single molecule â?¢ Time-resolved fluorescence - FRET, FRAP, FLIM, FCS â?¢ Coherent non-linear microscopies - SHG, THG, SFG, CARS â?¢ Raman, light scattering microscopy â?¢ Multi-dimensional imaging â?¢ Sub-wavelength resolution - near field microscopy, STED, PALM â?¢ Laser manipulation, ablation and microdissection, photoactivation â?¢ Optical tools in genomics, proteomics, phenomics, cytometry â?¢ Magnetic resonance and X-ray microscopy â?¢ Image processing and visualisation â?¢ Live cell and whole tissue imaging
A technical exhibition will be a feature of the Shanghai FOM2010 conference.
Welcoming you to the Shanghai FOM2010 conference and exhibition,
On behalf of the FocusOnMicroscopy society,
Qiushi Ren, Shanghai Jiao Tong University, China
Fred Brakenhoff, University of Amsterdam, The Netherlands
The FOM2010 conference incorporates the
23nd International Conference on 3D Image Processing in Microscopy
22th International Conference on Confocal Microscopy
You can view the abstracts of the in Krakow presented contributions under the 'History' button on the left and click 'FOM 2009' >> program. With the 'search' button you can in fact search all the contributions presented in the FOM conferences over the last five years.
It gives us great pleasure that we are able to announce that the next conference in the FOM series will take place in Shanghai, China from Sunday March 28 to Wednesday March 31, 2010. Please note that this is in the week before Easter 2010. The conference dinner and circus show will take place in the afternoon/evening of the last day of the conference, 31 March.
The conference will take place at the Shanghai Everbright Convention and Exhibition Center, in the center of Shanghai. Details of registration, abstract submission, deadlines, etc. will become available at a later moment on this website. When you wish to be kept informed please leave your email address here.
Focus on Microscopy 2010 is the continuation of a yearly conference series presenting the latest innovations in optical microscopy and their application in biology, medicine and the material sciences. Key subjects for the conference series are the theory and practice of 3D optical imaging, related 3D image processing, and reporting especially on developments in resolution and imaging modalities. The conference series is covers also the rapidly advancing fluorescence labeling techniques for the confocal and multi-photon 3D imaging of -live- biological specimens.
Typical topics of the upcoming FOM conference will include:
â?¢ Confocal and multiphoton-excitation microscopies â?¢ Novel illumination and detection strategies â?¢ Fluorescence - new labels, fluorescent proteins, quantum dots, single molecule â?¢ Time-resolved fluorescence - FRET, FRAP, FLIM, FCS â?¢ Coherent non-linear microscopies - SHG, THG, SFG, CARS â?¢ Raman, light scattering microscopy â?¢ Multi-dimensional imaging â?¢ Sub-wavelength resolution - near field microscopy, STED, PALM â?¢ Laser manipulation, ablation and microdissection, photoactivation â?¢ Optical tools in genomics, proteomics, phenomics, cytometry â?¢ Magnetic resonance and X-ray microscopy â?¢ Image processing and visualisation â?¢ Live cell and whole tissue imaging
A technical exhibition will be a feature of the Shanghai FOM2010 conference.
Welcoming you to the Shanghai FOM2010 conference and exhibition,
On behalf of the FocusOnMicroscopy society,
Qiushi Ren, Shanghai Jiao Tong University, China
Fred Brakenhoff, University of Amsterdam, The Netherlands
The FOM2010 conference incorporates the
23nd International Conference on 3D Image Processing in Microscopy
22th International Conference on Confocal Microscopy
Other CFPs
- The 5th International Conference on Bioinformatics and Biomedical Engineering (iCBBE 2011)
- 8th IFAC Symposium on Biological and Medical Systems
- IEEE International Symposium on Biomedical Imaging 2010 (IEEE ISBI 2010)
- ISPEC 2010 The 6th Information Security Practice and Experience Conference
- IEEE International Conference on Industrial Informatics INDIN 2010
Last modified: 2010-06-04 19:32:22