MIC 2012 - 2012 International Conference on Measurement, Information and Control (MIC)

MIC2012 is the premier forum for the presentation of new advances and research result in a wide variety of scientific areas with a common interest in improving measurement, sensor, signal process, image, computer science, information theory and control. The conference is a annual conference series, focusing on both theory and applications mainly covering the topic of Sensors and Transducers, Measurements, Signal Processing, Control and Automation, Laser Technology, Optoelectronic, Imaging processing and Communication. In addition to the technical sessions, there will be invited sessions, tutorials and keynote addresses. MIC2012 is sponsored by Harbin University of Science and Technology, technical co-sponsored by IEEE Harbin Section and supported by many other university and research institute. The objective of this Conference is to offer a meeting point for professionals and researchers from industry and academia to present and discuss recent advances in the field of measurement, information and control.

MIC2012 is the premier forum for the presentation of technological advances and research results in the fields of Measurement, Information and Control with leading engineers and scientists together from around the world. Topics of interest for submission include, but are not limited to:
Track I: Instrument and Sensor

Modeling and simulation
Reliability design and analysis
Testability Design
Wide-band analog signal conditioning technology
Dynamic local and reconfigurable FPGA technology
High-speed ADC & DAC and testing
Real-time signal processing technology
DDS&PLS
Bus Interface Technology
Digital, intelligent, virtualization, integration, automation, systematic, network, modular and micro technology
Advanced sensors, preceptor, actuator and RFID technology
Other

Track II: Measurement, Test and Metrology

Measurement signal, 2D&3D data processing
Voltage, power, frequency and impedance precision measurement
Quantum etalon and transfer
Processed surface detection technology and instrument
Light and laser wavelength, power and spectrum measurements
RF、MW、MMW、OW、LASER and Radiation measurement
Thermal property measurement
Function, structure, bypass, boundary scan and built-in test
Virtual Test and Measurement
Other

Track III: Computer

High-performance processors and intelligent instrument
Parallel, array and network computing and applications
Pervasive computing and terminal equipment
Fuzzy neural computing and applications
Speech, image, video and 3D data processing
Artificial intelligence and expert system based computer fault diagnosis
Simulated testing of computer equipment and network connectivity discovery
Software module design entities and integration technology
Software bug mining
Information security and network protection

Track IV: Communication

Advanced encoding / decoding, modulation / demodulation and multiplexing
Novel access, switching, routing technology
Private mobile radio
Corporative diversity radio (CDR)
Software Defined Radio (SDR)
Cognitive radio
Wireless network fusion technology
Bluetooth, ZigBee, WiFi technology and the applications on the instrument
Data Communication Tester and Analyzer

Track V: Control

Adaptive, robust, distributed and optimized control
Embedded systems and micro electromechanical systems technology and applications
Self-control and automatic equipment
Navigation, Guidance, Control and Instrumentation
Thermal and electrical process control and instrumentation
Automotive Instrumentation and Control
Automatic online test and diagnosis for control equipment
Cybernetics and applications
Other