VTS 2021 - IEEE VLSI Test Symposium 2021

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield,
reliability and security of microelectronic circuits and systems. The 2021 edition of VTS will be an online
virtual interactive live event.The VTS Program Committee invites original, unpublished paper submissions
for VTS 2021. Proposals for the innovative practices and special sessions tracks are also invited.
Major topics include but are not limited to:
Analog, Mixed-Signal, RF Test
ATPG & Compression
Silicon Debug
Automotive Test & Safety
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect & Fault Tolerance
Delay & Performance Test
Design for Testability, Yield or Reliability
Pre-silicon Design Verification & Validation
Post-silicon Validation
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test and
Reliability
FPGA Test
Fault Modeling and Simulation
Hardware Security
Low-Power IC Test
Machine Learning in Test,Yield and
Reliability
Microsystems/MEMS/Sensors Test
Memory Test and Repair
On-Line Test & Error Correction
Power & Thermal Issues in Test
System-on-Chip (SOC) Test
Test & Reliability of Biomedical Devices
Test & Reliability of High-Speed I/O
Test & Reliability of Machine Learning
Systems
Test Quality & Reliability
Test Standards & Economics
Test Resource Partitioning
Transient & Soft Errors
2.5D, 3D & SiP Test
Yield Optimization