DFMY 2011 - 2011 5th IEEE International Workshop on Design for Manufacturability and Yield (DFM&Y)

Increased manufacturing susceptibility in today’s nanometer technologies requires up to date solutions for yield optimization. In fact, designing an SoC for manufacturability and yield aim at improving the manufacturing process and consequently its yield by enhancing communications across the design ? manufacturing interface. A wide range of Design-for-Manufacturability (DFM) and Design-for-Yield (DFY) methodologies and tools are proposed today. Some of which are leveraged during the back-end design stages, and others have post design utilization, from lithography up to wafer sort, packaging, final test and failure analysis. DFM can dramatically impact the business performance of chip manufacturers. It can also significantly affect age-old chip design flows. Using a DFM solution is an investment and thus choosing the most cost effective one(s) requires trade-off analysis. The workshop analyzes this key trend and its challenges, and gives the opportunity to discuss a range of DFM and DFY solutions for today's SoC designs.

Representative topics include, but are not limited to the following:
Analog and Mixed-Signal DFM
Test-Based Yield Learning
Electrical, Design-Driven DFM
Built-in Repair Analysis and Self-Repair
Random Defectivity and Critical Area
Adaptive Design Techniques in DFM/DFY
Embedded Test and Diagnosis
OPC and RET
DFM for 3D Integration
DFM at System/Architecture Level
Process Monitoring IP
Statistical Design
Design-Aware Manufacturing
Yield Enhancement IP
Yield Management

Information for Authors
To present at the Workshop, authors are invited to submit unpublished extended abstracts or full papers, 2 to 4 pages in length. Each submission should include a short abstract of 50 words, and keywords. The review process is blind. Please do not include author names or affiliations. Proposals for embedded tutorials and panel discussions are also invited. Submit a copy of your paper proposal as a PDF at http://www.easychair.org/conferences/?conf=dfmy201.... The goal of the workshop is to foster unrestricted discussion in the field of design-manufacturing interactions. Copies of papers will be provided to attendees in the form of Workshop Notes, but no proceedings will not be published. Therefore, accepted papers can still be submitted to other conferences and journals.

DFM&Y workshop is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC) and the IEEE Councilon Electronic Design Automation (CEDA).