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2020 - Metrology - Statistical Analysis of Measurement Uncertainty
Date2020-07-01
Deadline2020-06-20
VenueOnline event, USA - United States 
KeywordsMetrology; Measurement uncertainty; Measurement uncertainty calculation
- 8th International Conference on Measurement, Instrumentation, and Electronics(ICMIE 2025)
- 2nd International Conference on Measurement, Communication and Virtual Reality(MCVR 2025)
- 9th International Conference on Computing and Data Analysis(ICCDA 2025)
- 7th International Conference on Statistics: Theory and Applications (ICSTA 2025)
- 2025 2nd International Conference on Pattern Analysis and Machine Intelligence (ICPAMI 2025)
Topics/Call fo Papers
Fundamental Vocabulary
Fundamental Concepts
Gage R&R (ANOVA method)
Gage Correlation
Gage Linearity
Gage Bias
Uncertainty Budgets
Guard-banded Specifications
Fundamental Concepts
Gage R&R (ANOVA method)
Gage Correlation
Gage Linearity
Gage Bias
Uncertainty Budgets
Guard-banded Specifications
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Last modified: 2020-05-16 23:52:27