IMS3TW 2011 - 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2011)

IMS3TW’11 will continue to address the traditional technology spectrum of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). In this year’s program, a keynote speech, two special sessions, and a penal have been organized: (Preliminary Technical Program is now available !!!!)
https://sites.google.com/site/ims3tw2011/
Keynote speaker: Dr. Naresh R. Shanbhag, UIUC
"System-assisted mixed-signal design"

Special Session: Current Industrial Practices for Analog/Mixed-Signal/RF IC Test
Organizer: TM Mak, Intel, USA

? Elida de-Obaldia, Texas Instruments, USA
? Bryan Casper, Intel, USA
? Michael Laisne, Qualcomm, USA

Special Session: Lab-on-Chip Test Issues
Organizer: A. Simonian, Auburn University, NSF Bio-sensors Program Director, USA

? Holger Schmidt, University of California, Santa Cruz, USA
? Ali Adibi, Georgia Tech, USA
? M.A. Miled and M. Sawan, École Polytechnique de Montréal, Canada

Panel: "Are sensors and mixed-signal ICs a threat to safety in cars"
Moderator: Hans Kerkhoff, Univ. of Twente ? The Netherlands
Organizer: Krishnendu Chakrabarty, Duke Univ. ? USA

Social Program: Santa Barbara is known for its world-class wine and vineyards. In this year’s social program, we will visit two local wineries in the Santa Ynez Valley.

Prospective authors are invited to submit papers on the topics of interest. Submissions should be via the workshop web-site and consist of either an extended summary of at least 750 words or a full paper. The accepted papers will be published by Conference Publishing Services (CPS) in proceedings available on the IEEE digital library (EXPLORE). Selected papers from the workshop will be invited for submission to a special issue of Journal of Electronic Testing (JETTA).

Primary Topics of Interest include:

Test & Design for (on/off-line) Test
Verification & Design for Verification
Reliability & Design for Reliability
Post-Silicon Validation
Fault/Error Modelling & Simulation
Diagnosis & Design for Debug/Diagnosis
Fault Tolerance
Pertaining to the following systems or underlying technologies:
Analog/Mixed-Signal Circuits
Biomedical Circuits & Systems
Lab-on-Chip
MEMS
RF & Wirelessly Controlled Devices
Microfluidics
Optoelectronics & Photonics
Heterogeneous Systems
Drug Delivery Microsystems
Implantable Devices
Embedded Systems
Important Dates
Submission deadline: February 21, 2011 (extended)
Notification of acceptance: March 21, 2011
Camera-ready full papers: April 21, 2011