IOLTS 2012 - 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council.

The topics include (but are not limited to) the following ones:
? Reliability issues in nanometer technologies
? Radiation effects
? Design for reliability
? Design for variability
? On-line power monitoring and control
? On-line current, temperature, etc, monitoring
? Secure circuit design
? Fault-based attacks and counter measures
? Self-checking circuits and coding theory
? On-line testing of analog and mixed signal circuits
? On-line testing in automotive, railway, avionics, industry
? On-line testing in the continuous operation of large systems
? Field diagnosis, maintainability and reconfiguration
? Fault-tolerant and fail-safe systems
? Dependability evaluation
? Dependable systems design
? On-line and off-line built-in self-test
? Synthesis of on-line testable circuits