CTA 2018 - The 2nd IEEE International Workshop on Combinatorial Testing and its Applications

Combinatorial methods are a promising modern approach to software testing. In particular, pairwise testing, which requires testing all pairs of possible values for any pair of input parameters, has shown a high level of fault detection. A more general approach, t-wise testing, which is an extension of pairwise testing for t from 3 to 6, considers a combination of any t input parameter values to be covered by at least one test. It requires more test cases but provides even better results. Combinatorial testing (CT) is also an effective approach to testing hardware and software configurations. The CTA 2018 workshop aims to bring together researchers and practitioners working on CT. The workshop will provide a platform for the discussion of problems in the theory and practice of CT with a focus on its applications in different domains. Participants will be able to use this opportunity to share their knowledge through informal discussions, develop new ideas, and establish new collaborations on CT topics.
The topics of interest include, but are not limited to:
Theoretical basis of CT
Methods, models, and algorithms for combinatorial test generation
CT for configuration testing
CT for input testing
CT for security testing
Types of faults detected by CT
CT effectiveness
CT coverage
Comparison of different CT methods
Comparison of CT with other testing approaches
Combining CT with other testing approaches
Experimental evaluation of CT
Tools for combinatorial test generation
Tools for measuring CT coverage
Combinatorial test automation
Case studies and industrial reports on CT applications
Analysis of practical problems during CT application
Domain-specific applications of CT