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Process Capability 2018 - Statistical Process Control Methods | Process Capability 2018

Date2018-02-01 - 2018-02-02


VenueDetroit, MI, USA - United States USA - United States

KeywordsStatistical Process Control Me; Statistical Process Control; Process Capability 2018


Topics/Call fo Papers

Course "Statistical Process Control & Process Capability" has been pre-approved by RAPS as eligible for up to 12 credits towards a participant's RAC recertification upon full completion.
This course teaches participants the fundamental concepts and methods needed to establish effective control charts and estimate process capability. In addition to learning traditional control charts (e.g. xbar, r/s), participants will be exposed to other useful charts for handling multiple sources of variation (within/between) and short production runs. Practical aspects of implementing SPC on the shop floor are also discussed.
Estimating process capability for both normal and non-normal data is discussed. The meaning and limitations of popular capability are presented in detail.
This highly interactive course will allow participants the opportunity to practice applying SPC techniques with various data sets. The objective is to provide participants with the key tools and knowledge to be able to apply the methods effectively for their own processes.
Why you should attend :
1. Understand SPC terminology and basic concepts
2. Implement traditional control charts for variable and attribute data
3. Diagnose control charts to detect process instability
4. Ensure appropriate sampling strategies and sample sizes
5. Choose the correct type of chart for various applications
6. Estimate Process Capability (For Normal and Non-Normal Data)
7. Understand limitations of popular capability indices (Cp, Cpk)
8. Develop awareness of specialized charting techniques and when to use them
9. Be able to make immediate improvements in the implementation of SPC in your organization
Who will benefit:
• Quality & Process Engineers
• Quality Technicians
• SPC Supervisors
• Production Supervisors
• Personnel involved in process development and validation
• Laboratory Personnel
• Manufacturing/Operations Personnel
• Process Improvement Personnel
• Supplier Quality Personnel
Day 1 Schedule
Lecture 1: Variation Fundamentals
• Concept of Variation
• Data Types
• The Normal Distribution
• Control Chart Concepts/Examples
• Control Limits vs. Specification Limits
• Definition of Control/Stability
Lecture 2: Variation Fundamentals (cont'd)
• Definition of Quality
• Sources of Variation
• Process Capability Concepts
• Quality Control vs. Process Control
• Basic Statistics
• Individuals, Averages, and the Central Limit Theorem
Lecture 3: Traditional Control Charts
• Constructing Charts (Variable Data)
• Xbar/R , Xbar/S, I-MR Charts
• Chart Signals for Special Causes
• Interpreting Charts
• Type I and Type II Errors
Lecture 4: Traditional Control Charts
• Re-computing Control Limits
• Sampling Procedures and Frequency
• Rational Samples
• Chart Sensitivity / Sample Size
• Determining Appropriate Sample Sizes
• Control Chart Selection
Day 2 Schedule
Lecture 1: Process Capability
• Stability vs. Capability
• Types of Capability Assessments
• Estimating PPM / Proportion Defective
• The Standard Normal (Z Values)
Lecture 2: Process Capability (cont'd)
• Capability Indices: Cp, Cpk, Pp, Ppk
• Interpreting Indices
• Process Capability for Non-Normal Data
Lecture 3: Other Control Charts
• Charts for Attribute Data
• Charts for Short Production Runs
Lecture 4: Other Control Charts
• Within/Between Charts (Multiple Locations)
• CUSUM Charts
Steven Wachs
Principal Statistician, Integral Concepts, Inc
Steven Wachs has 25 years of wide-ranging industry experience in both technical and management positions. Steve has worked as a statistician at Ford Motor Company where he has extensive experience in the development of statistical models, reliability analysis, designed experimentation, and statistical process control.
Steve is currently a Principal Statistician at Integral Concepts, Inc. where he assists manufacturers in the application of statistical methods to reduce variation and improve quality and productivity. He also possesses expertise in the application of reliability methods to achieve robust and reliable products as well as estimate and reduce warranty.
M.A., Applied Statistics, University of Michigan, 2002
M.B.A, Katz Graduate School of Business, University of Pittsburgh, 1992
B.S., Mechanical Engineering, University of Michigan, 1986
Location: Detroit, MI Date: February 1st & 2nd, 2018 and Time: 9:00 AM to 6:00 PM
Venue: Hilton Garden Inn Detroit Metro Airport 31800 Smith Road, Romulus, Michigan, 48174, USA
Price: $1,295.00 (Seminar Fee for One Delegate)
Register now and save $200. (Early Bird)
Until January 01, Early Bird Price: $1,295.00 From December 31 to January 30, Regular Price: $1,495.00
Register for 5 attendees Price: $3,885.00 $6,475.00 You Save: $2,590.00 (40%)*
Register for 10 attendees Price: $7,122.00 $12,950.00 You Save: $5,828.00 (45%)*
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Last modified: 2017-12-07 15:09:49