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2012 21st Asian Test Symposium (ATS)

Topics/Call fo Papers

IEEE Conference Record #: 19615

Conference Title: 2012 21st Asian Test Symposium (ATS)

Conference Acronym: ATS

Conference Dates: 11/19/2012 to 11/22/2012

Location: Toki Messe Niigata Convention Center

City: Niigata

Country: Japan


Exhibits: N No. of Exhibits: 0 Tutorials: Y Attendance: 130 Producing Publication: N Concentration Banking Info: Y

Conference Scope: The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.

Conference Keywords: asian, test, ats, electronic testing, design for testability, design verification and validation, diagnosis and debug, dependable system, software testing, test quality

Conference Focus: Application,Scientific/Academic

Abstract Submission Date:

Notification of Acceptance:

Final Paper Submission Date: